JASCO provides the most complete selection of FT-IR capability from education and routine analysis to high performance research systems plus specially optimized dedicated systems for advanced technology applications such as measuring film thickness and CVD in-situ monitoring for semiconductor research.

The JASCO FT/IR-4000 and FT/IR-6000 Series redefine the application of this powerful, easy-to-use technique. Each compact model offers reliable operation with the highest signal-to-noise ratio in the industry. Featuring a highly stable interferometer and AccuTrac™ DSP technology enabling rapid and accurate tracking of mirror position and velocity for optimum signal-to-noise performance.

The JASCO FT/IR-4100 and FT/IR-4200 were designed to provide operational features and sensitivity levels found only in more expensive instruments. The innovative technology incorporated in these instruments results in exceptionally high signal-to-noise ratio specifications. Both models offer exceptional flexibility and can be easily upgraded to meet new requirements. Optional expandability includes microanalysis with an IR microscope, IR imaging with a multichannel microscope, and the rapid scan option. The JASCO Quick Start System enables users of all experience levels to measure samples and perform data processing functions quickly and easily with a simple push of a button.