Magellan XHR Scanning Electron Microscope from FEI

Magellan XHR Scanning Electron Microscope from FEI

Magellan XHR Scanning Electron Microscope from FEI

Description

The Magellan™ XHR SEM family of scanning electron microscopes (SEM) enables scientists and engineers to quickly see things they could not see before: highly-sensitive surface images, looking top-down or at an angle, and at resolutions below one nanometer. This important breakthrough in electron microscopy is made possible thanks to the revolutionary monochromatized gun of the Magellan™ XHR SEM column, which enables microscopists to associate high spatial resolution with very shallow beam penetration. The Magellan™ XHR SEM family of scanning electron microscopes (SEM) extends the range and capabilities of traditional nanoscale SEM imaging and analysis with the speed and ease-of-use of a traditional scanning electron microscope (SEM), with no restriction to sample size.

Features
  • Subnanometer resolution from 1 kV to 30 kV with uncompromised stability and beam currents to up to 20 nA
  • Innovative electron optics, including FEI’s patented UniColore (UC) technology that enables an energy spread of less than 0.2 eV
  • High throughput and fast ‘time to answer’ by performing material and defect analysis on a single tool
  • Landing energies down to 50 V for surface sensitive high resolution imaging
  • High precision, high stability stage, offering XHR imaging on the complete surface of a 100 x 100mm sample, in a large analytical chamber
  • No compromises in sample size, shape, composition, preparation
  • Application versatility that includes analysis and prototyping
  • Simple and easy to use, as any SEM should be

  • Detailed Specifications
  • ItemMagellan XHR Scanning Electron Microscope
  • CompanyFEI
  • PriceInquire
  • QuantityEA
  • TypeAnalytical Scanning
  • Resolution0.8 nm (15 kV in SE mode), 0.9 nm (1 kV in SE mode) and 1.5 nm (200 V in SE mode)
  • Total MagnificationInquire
  • Specimen Size100 mm (diameter), 8.7 or 12 mm (thickness)
  • Probe Current1 pA to 22 nA
FEI
FEI
North America NanoPort
5350 NE Dawson Creek Drive
Hillsboro, Oregon 97124
United States
Phone: (503) 726 7500
Website: www.fei.com