Continuing more than 70 years of microscopy innovation, Hitachi offers the HT7710 STEM with maximum performance and productivity for in-situ analysis.
The HT7710's radical design incorporates the ergonomics and user friendliness of a SEM with the advanced resolution and analytical capabilities of a TEM/STEM. It features completely digital imaging supported by a redesigned viewing chamber which accommodates Hitachi’s brightfield and darkfield STEM detectors.
STEM Performance for Soft/Hybrid Materials—40-120kV with a magnification range of 100-800,000X and image recording resolutions up to 5120 X 3840
High Magnification and Large FOV STEM—Ideal for high-resolution lattice imaging, bulk crystal structure, and nanoparticle analysis
Flexible Port Configurations—BF/DF STEM, EDS detectors, and cameras for high-throughput imaging and compositional data
Intuitive STEM GUI and Automation Features—All STEM images instantly archived in Hitachi’s EMIP database software
Optional High-Resolution Objective Lens– 1.4Å at low accelerating voltages with minimal beam damage
- HT7710 120kV BF/DF STEM
- Hitachi High Technologies America, Inc.
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- High-Performance, High-Resolution, Bright Field (BF), Dark Field (DF)
- 1.5 nm at 100kV
- 1,000 to 800,000x (High Mag mode), 1,000 to 100,000x (Normal mode), 100 to 2,000x (Low Mag mode)