NEX QC Energy Dispersive X-ray Fluorescence Analyzer from Rigaku

NEX QC Energy Dispersive X-ray Fluorescence Analyzer from Rigaku

NEX QC Energy Dispersive X-ray Fluorescence Analyzer from Rigaku

Description

As a premium low cost benchtop Energy Dispersive X-ray Fluorescence (EDXRF) spectrometer, the Rigaku NEX QC delivers wide elemental coverage with an easy-to-learn software interface in a robust package designed for industrial at-line quality control elemental analysis applications.

Optimized for quality control applications
Specifically designed for routine quality control applications, the new Rigaku NEX QC features an intuitive "icon-driven" touch screen interface for easy operation and a built-in printer for convenience.

High precision with broad elemental coverage
The shuttered 50kV X-ray tube and Peltier cooled semiconductor detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (50 kV), along with multiple automated X-ray tube filters, provides a wide range of applications versatility and low limits-of-detection (LOD).

Autosampler, helium and FP options
Options include fundamental parameters, automatic sample changer, sample spinner and helium purge for enhanced light element sensitivity.

Features
  • Analyze 11Na to 92U non-destructively
  • Solids, liquids, alloys, powders and thin films
  • 50kV X-ray tube for wide elemental coverage
  • Semiconductor detector for superior data quality
  • Modern smartphone style "icon driven" user interface
  • Multiple automated tube filters for enhanced sensitivity
  • Convenient built in thermal printer
  • Low cost with unmatched performance-to-price ratio
  • Optional fundamental parameters

  • Detailed Specifications
  • ItemNEX QC Energy Dispersive X-ray Fluorescence Analyzer
  • CompanyRigaku
  • PriceGet Quote
  • Catalog NumberNEX QC
  • QuantityEA
  • Detector(s)Peltier Thermo-electric Cooled Semiconductor Detector
  • PrincipleEnergy Dispersive X-ray Fluorescence (EDXRF)
  • Sample TypeSolids, Liquids, Alloys, Powders and Thin Films
  • X-Ray Tube50 kV X-ray Tube (max. 4 W)
  • Goniometer TypeInquire
  • Element Range11Na to 92U
  • Sample ChamberAir or Helium
  • Analysis Diameter32 or 40 mm
Rigaku
Local Office
Rigaku
Rigaku Americas Corporation
9009 New Trails Drive
The Woodlands, TX 77381-5209
United States
Phone: +1-281-362-2300
Fax: +1-281-364-3628
Website: www.rigaku.com
International Office
Rigaku
Rigaku Japan | Rigaku Corporation
4-14-4, Sendagaya
Shibuya-Ku, Tokyo 151-0051
Japan
Phone: +81 3-3479-0618
Phone: +81 3-3479-6012 (SEMI)
Fax: +81 3-3479-6112
Website: www.rigaku.com
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