Description
Incorporating a high-performance semiconductor detector, the EDX-8100 spectrometer offers excellent sensitivity, resolution, and throughput for an array of applications, from general screening analysis to advanced materials research.
The EDX-8100 system's state-of-the-art semiconductor detector (SDD) offers a high fluorescent X-ray count per unit time. This enables precise, high-resolution analysis while increasing throughput, allowing researchers and labs to increase their productivity without sacrificing accuracy. The detectoralso has a special ultra-thin-film window material that is able to detect ultra-light elements such as carbon (C), oxygen (O), and fluorine (F). In addition, since it is electronically cooled, the SDD does not require liquid nitrogen, reducing both operating costs and maintenance requirements.
Additional features include: - Measurement range of 6C to 92U (EDX-8100)
- Five primary filters – enable highly sensitive analysis of trace elements
- Sample observation camera
- Large sample chamber – accommodates virtually any sample type
PCEDX Navi operating software features a simple but refined user interface, and offers intuitive operation, easy instrument initialization and startup, and a variety of report formats. A variety of optional equipment, including a vacuum measurement unit, helium purge unit, and screening analysis kit, is available to address specific applications.