NaioAFM Atomic Force Microscope System from Nanosurf AG

NaioAFM Atomic Force Microscope System from Nanosurf AG

NaioAFM Atomic Force Microscope System from Nanosurf AG

Description

The NaioAFM is the ideal atomic force microscope for nanoeducation and small sample measurements. This all-in-one AFM system provides solid performance and easy handling, with a price tag and footprint that fit anyone and any place.

Features
  • Integrated controller, airflow shielding, vibration isolation, and XY-table (12 mm)
  • High resolution top view camera and side view sample observation built in
  • Feature-complete: All standard operating modes available
  • Simple cantilever exchange: no laser or detector adjustment required
  • No system setup needed: just plug into your PC and start the software
  • User-friendly software wizards quickly prepare measurement parameters

  • Detailed Specifications
  • ItemNaioAFM Atomic Force Microscope System
  • CompanyNanosurf AG
  • PriceGet Quote
  • Catalog NumberInquire
  • QuantityEA
  • Operating Mode(s)Dynamic force, Static force, Phase contrast, Magnetic force, Electrostatic force, Spreading resistance, Force modulation, Multiple spectroscopy, Lithography and Manipulation modes.
  • Scan Range70 µm (max)
  • Vibration IsolationPassive vibration isolation included (active systems available as an option)
Nanosurf AG
Nanosurf AG
Gräubernstrasse 12–14
4410 Liestal
Switzerland
Phone: +41 61 927 47 47
Fax: +41 61 927 47 00
Website: www.nanosurf.com