Time of Flight Mass Spectrometer (TOF MS)

Time-of-flight mass spectrometers (TOF MS) do exactly what their name suggests: determine an ion’s mass-to-charge ratio (m/z) based on how long it takes for that ion to travel down the instrument’s “flight tube” and reach the detector. Frequently, though not exclusively coupled to matrix-assisted laser desorption ionization (MALDI) sources, TOF MS come in a variety of configurations, including a single-stage time-of-flight mass spectrometer, a multi-stage TOF/TOF, and even a hybrid quadrupole-TOF (Q-TOF) instrument; the latter two enable MS/MS applications. Often, time-of-flight mass spectrometers contain two detectors: a linear detector at the end of the flight tube, and a “reflector” detector, which captures ions that were redirected back towards the source by a “reflectron.” The reflectron serves two purposes: correcting for discrepancies in initial kinetic energy of identically sized molecules (which would cause them to reach the detector at different times and thus, have different apparent m/z values) and lengthening the flight path, improving resolution.

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CompanyShimadzuShimadzu
ItemAxima Assurance MALDI Time of Flight Mass SpectrometerAxima Confidence MALDI TOF Mass Spectrometer
Citations
Figures
Catalog NumberAXIMA AssuranceAxima Confidence
Price
Ionization Method(s)MALDIMALDI
Mass AnalyzerTOFTOF
Resolution>5000 FWHM5000 FWHM in linear mode; 15000 FWHM in reflectron mode
Scanning SpeedInquireInquire
Mass Range1 kDa to 500 kDa1 kDa to 500 kDa
Description

An affordable, robust option for laboratories requiring routine manual or automated analysis of a wide variety of sample classes, the AXIMA Assurance provides high-quality, rapid MALDI mass spectra and an array of software tools for data processing and reporting. Incorporating a variable repetition

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An affordable, robust option for routine sample analysis performed manually or automatically, the AXIMA Confidence offers reliable mass information and MS/MS-derived structural detail. A linear mode enables outstanding levels of analysis of high-molecular weight samples while the reflectron mode,

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QuantityEAEA
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