Atomic Force Microscopes (AFM Microscope)

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Easyscan 2 AFM Atomic Force Microscope System

Easyscan 2 AFM Atomic Force Microscope System

Nanosurf AG

  • Scan Range: 10 or 100 µm (max)
  • Operating Mode(s): Dynamic force, Static force, Phase contrast, Magnetic force, Electrostatic force, Spreading resistance, Force modulation, Multiple spectroscopy, Lithography and Manipulation modes.
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FlexAFM Atomic Force Microscope

FlexAFM Atomic Force Microscope

Nanosurf AG

  • Scan Range: Inquire
  • Operating Mode(s): Dynamic force, Static force, Lateral force, Phase contrast, Magnetic force, Electrostatic force, Spreading resistance, Force modulation, Multiple spectroscopy, Lithography and Manipulation modes.
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LensAFM Atomic Force Microscope and Lens

LensAFM Atomic Force Microscope and Lens

Nanosurf AG

  • Scan Range: 70 µm (max)
  • Operating Mode(s): Dynamic force, Static force, Phase contrast, Magnetic force, Electrostatic force, Spreading resistance, Force modulation, Multiple spectroscopy, Lithography and Manipulation modes.
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NaioAFM Atomic Force Microscope System

NaioAFM Atomic Force Microscope System

Nanosurf AG

  • Scan Range: 70 µm (max)
  • Operating Mode(s): Dynamic force, Static force, Phase contrast, Magnetic force, Electrostatic force, Spreading resistance, Force modulation, Multiple spectroscopy, Lithography and Manipulation modes.
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NaniteAFM Mountable Atomic Force Microscope System

NaniteAFM Mountable Atomic Force Microscope System

Nanosurf AG

  • Scan Range: 10 or 100 µm (max)
  • Operating Mode(s): Dynamic force, Static force, Phase contrast, Magnetic force, Electrostatic force, Spreading resistance, Force modulation, Multiple spectroscopy, Lithography and Manipulation modes.
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Atomic Force Microscope alpha300 A

Atomic Force Microscope alpha300 A

WITec GmbH

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  • Scan Range: 100 x 100 x 20 um
  • Operating Mode(s): Contact Mode or Lateral Force, Pulsed Force, AC-Mode or Phase Imaging, Magnetic Force, Nanolithography or Nanomanipulation
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Confocal Raman and Atomic Force Microscope alpha500

Confocal Raman and Atomic Force Microscope alpha500

WITec GmbH

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  • Scan Range: 100 x 100 x 20 um
  • Operating Mode(s): Confocal Raman Microscopy and Imaging, Confocal Microscopy, Atomic Force Microscopy
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attoAFM I Atomic Force Microscope

attoAFM I Atomic Force Microscope

attocube systems AG

  • Scan Range: 40 x 40 um² (@ 300 K), 30 x 30 um² (@ 4 K)
  • Operating Mode(s): Contact, Non Contact, MFM, EFM, SGM, ct-AFM (conducting tip AFM)
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attoAFM/CFM Combined Atomic Force and Confocal Microscope

attoAFM/CFM Combined Atomic Force and Confocal Microscope

attocube systems AG

  • Scan Range: Inquire
  • Operating Mode(s): Non Contact (AFM tip)
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attoAFM/STM Combined Atomic Force and Scanning Tunneling Microscope

attoAFM/STM Combined Atomic Force and Scanning Tunneling Microscope

attocube systems AG

  • Scan Range: 40 x 40 um² (@ 300 K), 9 x 9 um² (@ 4 K)
  • Operating Mode(s): Non Contact, MFM, EFM, SGM
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Dimension FastScan Atomic Force Microscope (AFM)

Dimension FastScan Atomic Force Microscope (AFM)

Bruker

  • Scan Range: 35 x 35 um (X-Y range - typical), 30 um (X-Y range - min), >=3 um (Z range)
  • Operating Mode(s): ScanAsyst, Nanomechanical Mapping, TappingMode, TappingMode, PhaseImaging, Contact Mode, Lateral Force Microscopy, Lift Mode, MFM, EFM, Force Spectroscopy, Force Volume
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Innova-IRIS AFM-Raman System

Innova-IRIS AFM-Raman System

Bruker

  • Scan Range: Inquire
  • Operating Mode(s): Inquire
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N8 ARGOS Atomic Force and Scanning Probe Microscopy

N8 ARGOS Atomic Force and Scanning Probe Microscopy

Bruker

  • Scan Range: 20 x 20 x 3 um to 80 x 80 x 5 um (Hardware Linearized Scan, Motion in X-Y-Direction)
  • Operating Mode(s): Contact Mode, Non-contact Mode, Intermittent Contact Mode, Phase Contrast, Field Contrast for Magnetic or Electrical Characterizations and more
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N8 NEOS Atomic Force and Scanning Probe Microscopy

N8 NEOS Atomic Force and Scanning Probe Microscopy

Bruker

  • Scan Range: 20 x 20 x 3 um to 200 x 200 x 10 um (Hardware Linearized Scan, Motion in X-Y-Direction)
  • Operating Mode(s): Contact Mode, Oscillation Modes, Phase Contrast, Magnetic Force, Electrostatic Force and more
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N8 RADOS Atomic Force and Scanning Probe Microscopy

N8 RADOS Atomic Force and Scanning Probe Microscopy

Bruker

  • Scan Range: 80 x 80 x 5 um (Hardware Linearized Scan, Motion in X-Y-Direction)
  • Operating Mode(s): Contact Mode, Oscillation Modes, Phase Contrast, Magnetic Force, Electrostatic Force and more
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N8 TITANOS Atomic Force and Scanning Probe Microscopy

N8 TITANOS Atomic Force and Scanning Probe Microscopy

Bruker

  • Scan Range: 20 x 20 x 3 um to 200 x 200 x 8 um (16 um)
  • Operating Mode(s): Contact Mode, Oscillation Modes, Phase Contrast, Magnetic Force, Electrostatic Force and more
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NANOS Atomic Force and Scanning Probe Microscopy

NANOS Atomic Force and Scanning Probe Microscopy

Bruker

Related
  • Scan Range: 20 x 20 x 3 um to 80 x 80 x 5 um (Hardware Linearized Scan, Motion in X-Y-Direction)
  • Operating Mode(s): Contact Mode, Oscillation Modes, Phase Contrast, Magnetic Force, Electrostatic Force and more
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Academia AFM System

Academia AFM System

Nanonics Imaging Ltd

  • Scan Range: 70 micron XY, 5 micron Z (10 micron XY on request)
  • Operating Mode(s): Contact, Non Contact or Intermittent Contact Modes
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Combined SEM/FIB/AFM System

Combined SEM/FIB/AFM System

Nanonics Imaging Ltd

  • Scan Range: Inquire
  • Operating Mode(s): Contact, Non Contact or Intermittent Contact Modes in SPM
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CryoView 2000 Low Temperature SPM System

CryoView 2000 Low Temperature SPM System

Nanonics Imaging Ltd

  • Scan Range: 25 um (Z-range) or 50 um (XY-range)
  • Operating Mode(s): AFM - Contact, Non-Contact, Intermittent-Contact, Confocal Microscopy, Near-field Optical Microscopy
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Hydra Bio-SPM

Hydra Bio-SPM

Nanonics Imaging Ltd

  • Scan Range: 30, 100, 130 microns (XYZ) or 160 microns (XY)
  • Operating Mode(s): AC Mode, Contact Mode (Optional) or All AFM Modes of Operation with probe or sample scanning and more
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MultiView 2000 Scanning Probe Microscope

MultiView 2000 Scanning Probe Microscope

Nanonics Imaging Ltd

  • Scan Range: up to 100 um (XYZ scan range) or up to 200 um (XYZ combined scan range)
  • Operating Mode(s): Active channels, Functional modes, Manipulation modes, Spectroscopy modes, Optical Far-field, Optical Near-field
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MultiView 4000 Multiprobe Scanning Probe Microscope

MultiView 4000 Multiprobe Scanning Probe Microscope

Nanonics Imaging Ltd

  • Scan Range: 30, 100, 130 microns (XYZ) or 160 microns (XY)
  • Operating Mode(s): AFM - AC Mode, Contact Mode (Optional) or All AFM Modes of Operation with probe or sample scanning and more, Near-field Optical Imaging & Illumination, NanoIndentation and more
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Optometronic 4000 Multiprobe Near-Field Optical and AFM

Optometronic 4000 Multiprobe Near-Field Optical and AFM

Nanonics Imaging Ltd

  • Scan Range: 30, 100, 130 microns (XYZ) or 160 microns (XY)
  • Operating Mode(s): AFM - AC Mode, Contact Mode (Optional) or All AFM Modes of Operation with probe or sample scanning and more, Near-field Optical Imaging and Illumination, Differential Interference Contrast , Refractive-Index Profiling, Thermal Conductivity and Spreading Resistance Profiling and more
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NX10 Research AFM Microscope

NX10 Research AFM Microscope

Park Systems Inc

  • Scan Range: 50 x 50 um (XY Scanner), 15 um (Z Scanner)
  • Operating Mode(s): True Non-Contact AFM, Basic Contact AFM and DFM, Lateral Force Microscopy (LFM), Phase Imaging, Chemical Force Microscopy with Functionalized Tip, Electrochemical Microscopy (EC-STM and EC-AFM), Electric Force Microscopy (EFM), Dynamic Contact EFM (DC-EFM), Piezoelectric Force Microscopy (PFM), PFM with High Voltage and more
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XE-100 Research-Grade AFM Microscope

XE-100 Research-Grade AFM Microscope

Park Systems Inc

  • Scan Range: up to 100 x 100 um (XY Scanner), 12 or 25 um (Z Scanner)
  • Operating Mode(s): Basic Contact AFM and DFM, Lateral Force Microscopy (LFM), Phase Imaging, True Non-Contact AFM,Chemical Force Microscopy with Functionalized Tip, Electrochemical Microscopy (EC-STM and EC-AFM), Electric Force Microscopy (EFM), Dynamic Contact EFM (DC-EFM), Piezoelectric Force Microscopy (PFM), PFM with High Voltage, Force Distance (F-D) Spectroscopy, Force Volume Imaging, Spring Constant Calibration by Thermal Method and more
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XE-120 Research AFM Microscope

XE-120 Research AFM Microscope

Park Systems Inc

  • Scan Range: 100 x 100 um (XY Scanner), 12 or 25 um (Z Scanner)
  • Operating Mode(s): Basic Contact AFM and DFM, Lateral Force Microscopy (LFM), Phase Imaging, True Non-Contact AFM, Chemical Force Microscopy with Functionalized Tip, Electrochemical Microscopy (EC-STM and EC-AFM), Electric Force Microscopy (EFM), Dynamic Contact EFM (DC-EFM), Piezoelectric Force Microscopy (PFM), PFM with High Voltage, Force Distance (F-D) Spectroscopy, Force Volume Imaging, Spring Constant Calibration by Thermal Method and more
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XE-150 Research AFM Microscope

XE-150 Research AFM Microscope

Park Systems Inc

  • Scan Range: 100 x 100 um (XY Scanner), up to 25 um (Z Scanner)
  • Operating Mode(s): Basic Contact AFM and DFM, Lateral Force Microscopy (LFM), Phase Imaging, True Non-Contact AFM, Chemical Force Microscopy with Functionalized Tip, Electrochemical Microscopy (EC-STM and EC-AFM), Electric Force Microscopy (EFM), Dynamic Contact EFM (DC-EFM), Piezoelectric Force Microscopy (PFM), PFM with High Voltage, Force Distance (F-D) Spectroscopy, Force Volume Imaging, Spring Constant Calibration by Thermal Method and more
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XE-3DM AFM Microscope for High-Res 3D Metrology

XE-3DM AFM Microscope for High-Res 3D Metrology

Park Systems Inc

  • Scan Range: 100 x 100 um (XY Scanner - large mode), 50 x 50 um (XY Scanner - medium mode), 10 x 10 um (XY Scanner - small mode), 12 um (Z Scanner - high voltage mode), 1.7 um (Z Scanner - low voltage mode)
  • Operating Mode(s): True Non-Contact AFM
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XE-70 Research-Grade AFM Miscroscope

XE-70 Research-Grade AFM Miscroscope

Park Systems Inc

  • Scan Range: up to 100 x 100 um (XY Scanner), 12 or 25 um (Z Scanner)
  • Operating Mode(s): Basic Contact AFM and DFM, Lateral Force Microscopy (LFM), Phase Imaging, True Non-Contact AFM,Chemical Force Microscopy with Functionalized Tip, Electrochemical Microscopy (EC-STM and EC-AFM), Electric Force Microscopy (EFM), Dynamic Contact EFM (DC-EFM), Piezoelectric Force Microscopy (PFM), PFM with High Voltage, Force Distance (F-D) Spectroscopy, Force Volume Imaging, Spring Constant Calibration by Thermal Method and more
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XE-Bio Research AFM Microscope

XE-Bio Research AFM Microscope

Park Systems Inc

  • Scan Range: 100 x 100 um (XY Scanner), 25 um (Z Scanner)
  • Operating Mode(s): Standard Imaging, Basic Contact AFM and DFM, Lateral Force Microscopy (LFM), Phase Imaging, True Non-Contact AFM, Ion Conductance Microscopy (ICM), Force Distance (F-D) Spectroscopy, Force Volume Imaging, Spring Constant Calibration by Thermal Method, Raman Spectroscopy (Nano-Raman) or Tip-Enhanced Raman Spectroscopy (TERS)
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XE-HDM AFM Microscope

XE-HDM AFM Microscope

Park Systems Inc

  • Scan Range: 100 x 100 um (XY Scanner - high voltage), 10 x 10 um (XY Scanner - low voltage), 12 um (Z Scanner - high voltage), 1.7 um (Z Scanner - low voltage)
  • Operating Mode(s): True Non-Contact AFM, Scanning Electron (SEM) or Magnetic Force Microscopy (MFM)
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XE-PTR AFM Microscope for Metrology

XE-PTR AFM Microscope for Metrology

Park Systems Inc

  • Scan Range: 100 x 100 um (XY Scanner - high voltage), 10 x 10 um (XY Scanner - low voltage), 12 um (Z Scanner - high voltage), 1.7 um (Z Scanner - low voltage)
  • Operating Mode(s): True Non-Contact AFM
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Select up to 5 products from above to compare or request more information.
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Other Companies that sell Atomic Force Microscopes (AFM Microscope)

Renishaw plc

Gloucestershire, United Kingdom

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