Atomic force microscopes (AFMs), or scanning force microscopes, provide a high-resolution 3-D surface profile using a cantilever with a sharp tip to scan the surface to be imaged. AFM measures the deflection of the lever, not the force itself, with most systems using a laser beam deflection system. Scanning ranges of 1–100 µm are typical. AFM’s ability to image almost any type of surface, including biological samples, polymers, ceramics, and glass, with little sample preparation, lends it toward use in nanotechnology, the life sciences, electrochemistry, and materials science.
Modes of operation include contact mode; noncontact mode, which minimizes sample damage; force modulation; and tapping mode, which makes use of a piezoelectric element to vibrate the cantilever. Interesting features include dual-lens optics for nano education, easy tip exchange without laser adjustment, passive or active vibration isolation to eliminate noise, and systems optimized to measure larger samples.
Discover and compare Atomic Force Microscopes:
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| Company | WITec GmbH | WITec GmbH |
| Item | alpha300 A Atomic Force Microscope | TrueSurface™ Microscopy Topographic Imaging System |
| Citations | | |
| Catalog Number | alpha300 A | TrueSurface™ |
| Price | | |
| Description | The alpha300 A integrates an AFM system with a scientific grade optical microscope for superior optical access and high-resolution sample survey. The inclusion of a special AFM objective allows simultaneous cantilever and sample observation, which provides precise cantilever positioning and rapid The alpha300 A integrates an AFM system with a scientific grade optical microscope for superior optical access and high-resolution sample survey. The inclusion of a special AFM objective allows simultaneous cantilever and sample observation, which provides precise cantilever positioning and rapid alignment. The user-friendliness and versatility of this composite system can benefit an enormous variety of scientific endeavors.
All standard AFM modes are supported, assuring the highest flexibility throughout the full range of AFM applications. Whether you work in air or liquid environments, or even with delicate and soft samples, the alpha300 A is ideally suited to the investigation of topographic structures at the highest resolution. For high-performance materials research imaging tasks, the alpha300 can be equipped with the Pulsed Force Mode, allowing local surface properties such as local adhesion or stiffness to be imaged along with topography on the nanometer scale.... Read More | WITec´s True Surface Microscopy option (patent pending) allows confocal Raman imaging guided by surface topography. Confocal microscopy is often desirable due to its suppression of out-of-focus light but can be challenging when analyzing large or rough surfaces. In these cases, only those WITec´s True Surface Microscopy option (patent pending) allows confocal Raman imaging guided by surface topography. Confocal microscopy is often desirable due to its suppression of out-of-focus light but can be challenging when analyzing large or rough surfaces. In these cases, only those point s that are in focus contribute to the image. True Surface Microscopy follows the surface topography with high precision, so that even rough or inclined samples always stay in focus. To achieve this unique capability, the WITec alpha500 series can be equipped with a highly precise sensor for optical profilometry. The topographic coordinates from the profilometer measurement are used to perfectly follow the sample surface in confocal Raman imaging mode. The result is an image revealing chemical properties at the surface of the sample, even if this surface is rough or inclined.
Features - Extension for the WITec alpha500 series that combines Large Area Surface Topography profiling with Confocal Raman Imaging and/or AFM
- Unique combination (patent pending) delivers innovative application possibilities for new research techniques
- Ease-of-use through full integration with the alphaControl hardware and WITec Project Software environment
- Scan Speed up to 2000 pixels/s for rapid data acquisition
- Spatial Resolution of 10 - 25 µm laterally and < 100nm vertically to reveal an expanse of miniscule surface structures
- Light source: High brightness LED for highest throughput and accuracy
- Measuring distance: 10 mm – 16 mm providing wide-ranging sample size flexibility
- Multi-sensors easily configurable to meet virtually any application
... Read More |
| Scan Range | 100 x 100 x 20 um | 50 x 100 mm to 200 x 200 mm (Scan Range X/Y), 10 mm / 20 µm (Scan Range Z) |
| Operating Mode(s) | Contact Mode or Lateral Force, Pulsed Force, AC-Mode or Phase Imaging, Magnetic Force, Nanolithography or Nanomanipulation | Confocal+P6l Raman Microscopy and Imaging, Confocal Microscopy, Atomic Force Microscopy |
| Vibration Isolation | Integrated Active Vibration Isolation System | Integrated Active Vibration Isolation System |
| Get Quote | | |
Articles
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