Scanning Electron Microscopes (SEM)

A scanning electron microscope (also commonly abbreviated as SEM) uses beams of electrons to create magnified images of samples, as opposed to beams of light that a traditional microscope uses. Because the scanning electron microscope can magnify a sample up to 500,000 times its normal size and determine its chemical makeup, scanning electron microscopes have a wide range of applications. They are used for quality control in both the pharmaceutical and semiconductor industries, sample comparisons in forensics, diagnostics in medical labs, and in research labs to determine the composition of samples treated in different ways. Scanning electron microscopes have different kinds of signal detectors available that include back-scattered electrons (for imaging), characteristic X-rays (for determining types and amounts of elements present in the sample), transmitted electrons, and cathodoluminescence. Other variations in different scanning electron microscopes include availability of low or high vacuum mode and imaging options for bright field samples and/or dark field samples.

Click on the links below to discover and compare scanning electron microscopes from various manufacturers:

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MERLIN Field Emission Scanning Electron Microscopes
  • Type: FE-SEM
  • Resolution: Inquire
  • Total Magnification: Inquire
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SIGMA Field Emission Scanning Electron Microscopes
  • Type: FE SEM
  • Resolution: 1.3 to 2.8 nm (depending on acceleration voltage and model)
  • Total Magnification: Inquire
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NeoScope JCM-5000  Benchtop Scanning Electron Microscope
  • Type: Analytical, Benchtop
  • Resolution: 25 nm
  • Total Magnification: 10x to 20,000x
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Phenom G2 pro Desktop Scanning Electron Microscope
  • Type: Scanning
  • Resolution: 25 nm
  • Total Magnification: 20 to 45,000x
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Phenom G2 pure Scanning Electron Microscope
  • Type: Scanning
  • Resolution: 30 nm
  • Total Magnification: 20 to 17,000x
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Phenom ProX Desktop Scanning Electron Microscope
  • Type: Analytical, X-ray Analysis
  • Resolution: 25 nm (at 10 kV)
  • Total Magnification: 80 to 45,000x
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Phenom proX Desktop SEM with integrated Elemental mapping and Line Scan
  • Type: Analytical, X-ray Analysis, Integrated Elemental mapping, Line Scan
  • Resolution: 25 nm (at 10 kV)
  • Total Magnification: 20 to 45000x
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ASPEX EXplorer Scanning Electron Microscope
  • Type: Microanalysis, High Vac and Variable Pressure
  • Resolution: 135 eV (EDX)
  • Total Magnification: Inquire
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ASPEX EXpress<sup>x</sup> Scanning Electron Microscope
  • Type: Time-critical Microanalysis, High-Vac and Low-Vacuum Variable Pressure
  • Resolution: 130 eV (EDX), 30 nm (Image)
  • Total Magnification: Inquire
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ASPEX EXtreme Scanning Electron Microscope
  • Type: SEM/EDX, Microanalysis
  • Resolution: Inquire
  • Total Magnification: Inquire
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Magellan XHR Scanning Electron Microscope
  • Type: Analytical Scanning
  • Resolution: 0.8 nm (15 kV in SE mode), 0.9 nm (1 kV in SE mode) and 1.5 nm (200 V in SE mode)
  • Total Magnification: Inquire
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Combined SEM/FIB/AFM System

Combined SEM/FIB/AFM System

Nanonics Imaging Ltd

  • Type: Atomic force microscopy/Scanning Tunneling Microscopy
  • Resolution: Inquire
  • Total Magnification: Inquire
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INDUSEM Scanning Electron Microscope
  • Type: Analytical, Variable Pressure
  • Resolution: SE: 3 nm (30 kV) or 8 nm (3 kV); Low Vacuum (BSE): 3.5 nm (30 kV)
  • Total Magnification: Inquire
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LYRA 3 GM Nanotechnology FIB-FESEM Workstation
  • Type: Analytical, FIB-SEM, FE
  • Resolution: Inquire
  • Total Magnification: Inquire
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LYRA 3 XM Focused Ion Beam Field Emission Scanning Electron Microscopes (FIB-FESEM)
  • Type: FIB-SEM, FE, Micro-analytical, High Vacuum / Variable Pressure
  • Resolution: SEM Column (SE): 1.2 nm (at 30 kV); FIB Column (SE): <5 nm (at 30 kV)
  • Total Magnification: 2x to 1,000,000x
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MIRA 3 LM Field Emission Scanning Electron Microscopes (FESEM)
  • Type: Analytical, FE, High Vacuum / Variable Pressure
  • Resolution: In-Beam SE: 1 nm (at 30 kV) or 1.8 nm (at 1 kV); SE-ET: 1.2 nm (at 30 kV) or .5 nm (at 3 kV); Low Vacuum (LVSTD): 1.5 nm (at 30 kV) or 3 nm (at 3kV)
  • Total Magnification: 3.5x to 1,000,000x
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MIRA 3 XM Field Emission Scanning Electron Microscopes (FESEM)
  • Type: Analytical, FE, High Vacuum / Variable Pressure
  • Resolution: In-Beam SE: 1.0 nm (at 30 kV) or 1.8 nm (at 1 kV); SE-ET: 1.2 nm (at 30 kV) or 2.5 nm (at 3 kV); High/Low Vacuum (BSE): 2.0 nm (at 30 kV)
  • Total Magnification: 2x to 1,000,000x
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VEGA 3 LM Analytical Scanning Electron Microscopes (SEM)
  • Type: Analytical, High Vacuum / Variable Pressure
  • Resolution: SE: 2 or 3 nm (at 30 kV), 5 or 8 nm (at 3 kV); Low Vacuum (BSE, LVSTD): 2.5 or 3.5 nm (at 30 kV)
  • Total Magnification: Inquire
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VEGA 3 SB Analytical Scanning Electron Microscopes (SEM)
  • Type: Analytical, High Vacuum / Variable Pressure
  • Resolution: SE: 3 nm (at 30 kV) or 8 nm (at 3 kV); Low Vacuum (BSE, LVSTD): 3.5 nm (at 30 kV)
  • Total Magnification: Inquire
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VEGA 3 XM Analytical Scanning Electron Microscopes (SEM)
  • Type: Analytical, High Vacuum / Variable Pressure
  • Resolution: SE: 2 or 3 nm (at 30 kV), 5 or 8 nm (at 3 kV); Low Vacuum (BSE): 2.5 or 3.5 nm (at 30 kV)
  • Total Magnification: Inquire
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VELA 3 XM Focused Ion Beam Scanning Electron Microscopes (FIB-SEM)
  • Type: Micro-analytical, High Vacuum / Variable Pressure
  • Resolution: SEM Column (SE): 3.5 nm (at 30 kV); FIB Column (SE): <5 nm (at 30 kV)
  • Total Magnification: 2x to 1,000,000x
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Other Companies that sell Scanning Electron Microscopes (SEM)

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  • ASPEX Corp.
  • Carl Zeiss Microscopy
  • FEI
  • Nanonics Imaging Ltd
  • Nikon Instruments
  • Phenom-World BV
  • Tescan USA Inc.

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