Transmission Electron Microscope (TEM)

A transmission electron microscope uses electrons that are transmitted through a sample and projected onto a fluorescent screen, photographic film, or digital screen to produce a magnified image of the sample. Because a transmission electron microscope can help to study cell structure at a molecular level, they are used in many labs including medical, metallurgic, nanotechnology, and environmental. There are some variances in different transmission electron microscopes that include imaging sub-angstrom particles where other models can only go down to 2.5 angstroms. Some can do in situ imaging to see how the sample reacts to different environmental conditions, which is not available in other models.

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LIBRA 120 PLUS Transmission Electron Microscope
  • Type: Analytical
  • Resolution: Point to Point: 0.34 nm, Information Limit: <0.20 nm and STEM: <1.50 nm
  • Total Magnification: TEM: 8x to 630,000x; STEM: 50x to 1,000,000x; EELS: 20x to 315x
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LIBRA 200 Cs-TEM/STEM Transmission Electron Microscope
  • Type: Analytical, Scanning
  • Resolution: Point to Point: < 80 pm (@ 200 kV), STEM: < 0.1 nm (@ 200 kV)
  • Total Magnification: Inquire
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LIBRA 200 FE Transmission Electron Microscope
  • Type: Analytical, FE
  • Resolution: Point to Point: 0.24 nm, Information Limit: 0.14 nm and STEM: 0.30 nm
  • Total Magnification: TEM: 8x to 1,000,000x (for HR pole piece); STEM: 2000x to 5,000,000x; EELS: 20x to 315x (spectrum magnification)
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LIBRA 200 MC Transmission Electron Microscope
  • Type: Analytical, FE
  • Resolution: Point to Point: 0.24 nm, Information Limit: 0.14 nm and STEM: 0.30 nm
  • Total Magnification: TEM: 8x to 1,000,000x (for HR pole piece); STEM: 2000x to 5,000,000x; EELS: 20x to 315x (spectrum magnification)
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LIBRA Energy Filtering Transmission Electron Microscopes (EFTEM)
  • Type: Analytical, Energy Filtering
  • Resolution: Inquire
  • Total Magnification: Inquire
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H-9500 300kV TEM

H-9500 300kV TEM

Hitachi High Technologies America, Inc.

  • Type: Atomic Resolution, Gas Injection-Heating In-situ
  • Resolution: 0.10 nm (crystal lattice) or 0.18 nm (point-to-point)
  • Total Magnification: x200 to x1,500,000
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HD-2700 Cs Corrected STEM

HD-2700 Cs Corrected STEM

Hitachi High Technologies America, Inc.

  • Type: Scanning
  • Resolution: less than 0.1 nm
  • Total Magnification: Inquire
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HF-3300 300 kV FE TEM

HF-3300 300 kV FE TEM

Hitachi High Technologies America, Inc.

  • Type: Cold-Field Emission Gun, Analytical, High Resolution
  • Resolution: 0.10 nm (lattice) or 0.19 nm (point-to-point)
  • Total Magnification: 200x to 1,500,000x
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HT7700 120 kV Automatic TEM

HT7700 120 kV Automatic TEM

Hitachi High Technologies America, Inc.

  • Type: Automatic
  • Resolution: 0.20 nm (lattice)
  • Total Magnification: x200 to x600,000 (Zoom), x50 to x1000 (Low mag)
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HT7710 120kV BF/DF STEM

HT7710 120kV BF/DF STEM

Hitachi High Technologies America, Inc.

  • Type: High-Performance, High-Resolution, Bright Field (BF), Dark Field (DF)
  • Resolution: 1.5 nm at 100kV
  • Total Magnification: 1,000 to 800,000x (High Mag mode), 1,000 to 100,000x (Normal mode), 100 to 2,000x (Low Mag mode)
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