Field Emission Scanning Electron Microscope (FESEM)

Field emission scanning electron microscopes (FESEM) are a more powerful version of a scanning electron microscope. The FESEM uses a beam of electrons shot towards a sample to obtain information about it, including what the surface looks like and the chemical make up of the sample. The electrons interact with the surface molecules to relay information back to the user. The field emission scanning electron microscopes are so powerful that they can give clear images of a sample as small as 1½ nanometers.

Applications for FESEM

FESEMs are used in life sciences, organic chemistry, physics, and microbiology for both education and research.

Key considerations for purchasing a FESEM system

There are different degrees of resolution and magnification among field emission scanning electron microscopes.

Click on the links below to discover and compare field emission scanning electron microscopes from various manufacturers:

Showing 6 of 6 products
  • <<
  • >>
Get Quote for All
Select up to 5 products from below to compare or request more information.
MERLIN Field Emission Scanning Electron Microscopes
  • Applications: Material Science, Life Science and Semiconductor Applications
  • Resolution: Inquire
  • Total Magnification: Inquire
Compare or Get Quote for selected.
SIGMA Field Emission Scanning Electron Microscopes
  • Applications: Material Science, Life Science and Semiconductor Applications
  • Resolution: 1.3 to 2.8 nm (depending on acceleration voltage and model)
  • Total Magnification: Inquire
Compare or Get Quote for selected.
LYRA 3 GM Nanotechnology FIB-FESEM Workstation
  • Applications: Nano-Structuring, Manipulation, Imaging and Analysis
  • Resolution: Inquire
  • Total Magnification: Inquire
Inquire
Compare for selected.
MIRA 3 LM Field Emission Scanning Electron Microscopes (FESEM)
  • Applications: Image Acquisition and Signal Processing, Automated Analysis
  • Resolution: In-Beam SE: 1 nm (at 30 kV) or 1.8 nm (at 1 kV); SE-ET: 1.2 nm (at 30 kV) or .5 nm (at 3 kV); Low Vacuum (LVSTD): 1.5 nm (at 30 kV) or 3 nm (at 3kV)
  • Total Magnification: 3.5x to 1,000,000x
Inquire
Compare for selected.
MIRA 3 XM Field Emission Scanning Electron Microscopes (FESEM)
  • Applications: Image Acquisition and Signal Processing, Automated Analysis
  • Resolution: In-Beam SE: 1.0 nm (at 30 kV) or 1.8 nm (at 1 kV); SE-ET: 1.2 nm (at 30 kV) or 2.5 nm (at 3 kV); High/Low Vacuum (BSE): 2.0 nm (at 30 kV)
  • Total Magnification: 2x to 1,000,000x
Inquire
Compare for selected.
Select up to 5 products from above to compare or request more information.

Other Companies that sell Field Emission Scanning Electron Microscope (FESEM)

Tags:

Please Login or Register to Create Tags
  • Carl Zeiss Microscopy
  • Tescan USA Inc.

Note: Labcompare disclaims any information on this site.