VIS-NIR spectrometers are analytical instruments used to measure and analyze light absorption and reflectance in the visible and near-infrared regions of the electromagnetic spectrum. VIS-NIR spectrometers offer rapid analysis speeds by providing a non-destructive method of analyzing samples to provide insight into their composition, structure, and various other physical properties. VIS-NIR spectrometers are used in nearly all industries and can be used to perform a multitude of analyses including concentration analysis, quality control analysis, environmental monitoring, and numerous others. When comparing VIS-NIR spectrometers be sure to compare key specifications such as wavelength range, detector type, and resolution as these can all directly impact the quality of your analysis.
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Malvern Panalytical
- 350 to 2500 nm
- VNIR detector (350-1000 nm): 512 element silicon array
SWIR 1 detector (1001-1800 nm): Graded Index InGaAs Photodiode, Two Stage TE Cooled
SWIR 2 detector (1801-2500 nm): Graded Index InGaAs Photodiode, Two Stage TE Cooled - 3 nm @ 700 nm
6 nm @ 1400/2100 nm - VNIR - 9,000:1 @ 700 nm
SWIR 1 - 9,000:1 @ 1400 nm
SWIR 2 - 4,000:1 @ 2100 nm
Malvern Panalytical
- 350 to 2500 nm
- VNIR detector (350-1000 nm): 512 element silicon array
SWIR 1 detector (1001-1800 nm): Graded Index InGaAs Photodiode, Two Stage TE Cooled
SWIR 2 detector (1801-2500 nm): Graded Index InGaAs Photodiode, Two Stage TE Cooled - 3 nm @ 700 nm
10 nm @ 1400/2100 nm - VNIR - 9,000:1 @ 700 nm
SWIR 1 - 9,000:1 @ 1400 nm
SWIR 2 - 4,000:1 @ 2100 nm
Malvern Panalytical
- 350 to 2500 nm
- VNIR detector (350-1000 nm): 512 element silicon array
SWIR 1 detector (1001-1800 nm): Graded Index InGaAs Photodiode, Two Stage TE Cooled
SWIR 2 detector (1801-2500 nm): Graded Index InGaAs Photodiode, Two Stage TE Cooled - 3 nm @ 700 nm; 10 nm @ 1400/2100 nm
- VNIR: 9,000:1 @ 700 nm
SWIR 1: 9,000:1 @ 1400 nm
SWIR 2: 4,000:1 @ 2100 nm
Metrohm USA
- 350 to 1050 nm
- Inquire
- Inquire
- 250:1 (at full signal)
Select up to 5 products from above to compare or request more information.
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