EC-52000IC (Ion Cleaner) from JEOL USA, Inc.

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JEOL USA, Inc. for
EC-52000IC (Ion Cleaner)

Description

Ion Cleaner – EC-52000IC

Prevents specimen contamination
The EC-52000IC Ion Cleaner is a device that holds a specimen of an electron microscope under glow discharge, for removing hydrocarbon contaminants adhered to the specimen by utilizing physical and chemical reactions.
The Ion Cleaner prevents specimen contamination, which arises from accumulations of hydrocarbon contaminants when the specimen is irradiated with an electron beam in an electron microscope.

Features
  • You can perform specimen treatment while the specimen is being placed on the specimen holder.
  • You can perform cleaning without introducing special gas.