AFM probes, used in atomic force microscopy,
consist of a sharp tip with a radius of a few nanometers that is mounted on a reflective
cantilever. The probe, or tip, enables structural characterization of surfaces at the
molecular and atomic level.
AFM probes can image almost any surface, including
ceramics, polymers, glass, and biological samples, and are known for their ability to work
in air and liquid environments. AFM probes are used in the life sciences, materials science,
biotechnology, nanotechnology, and electrochemistry.
What Are Different Types of Atomic Force Microscopy Probes?
Materials of construction for AFM probes include silicon (Si), silicon nitrate,
platinum, and borosilicate glass, and a variety of chemical, biological, and metallic
coatings.
Nanowire probes are used in the semiconductor industry. Modes include
contact mode, where the tip is “dragged” across the surface of the sample, tapping mode,
which causes less damage to the tip and the surface, and noncontact mode, preferable for
measuring soft samples, such as thin films.
