NeoScope™ Benchtop SEM JCM-7000 from JEOL USA, Inc.

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JEOL USA, Inc. for
NeoScope™ Benchtop SEM JCM-7000

Description

An easy to use benchtop SEM with advanced features of full-sized SEMs. User can easily navigate from an optical image to high resolution SEM imaging and further analysis, set automatic conditions based on sample type and application, ensuring high quality results and enhanced productivity. Produces images of exceptional fidelity. Simple to use for any skill level to obtain outstanding SEM images and elemental analysis results in minutes.

Features:
  • Large specimen chamber
  • Secondary and backscatter electron detectors
  • Real-time 3D imaging
  • Option to add a fully embedded EDS with real-time, ‘Live’ analysis
  • High resolution (100,000X) and large depth of field
  • Selectable kV modes

Benefits:
  • View EDS spectra in real time as you search for the area of interest.
  • Highly-advanced Auto functions for automatic condition setting and image formation in minutes
  • High and low vacuum modes for managing a wide variety of samples