Description
New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago.
Overview:
- New 6th generation design
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Compact, fail-safe radiation enclosure
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Incident beam variable slit
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Simple installation and user training
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Factory aligned goniometer system
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Laptop computer operation
Measurements:
- Phase identification
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Phase quantification
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Percent (%) crystallinity
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Crystallite size and strain
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Lattice parameter refinement
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Rietveld refinement
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Molecular structure
Options:
- 8-position autosampler
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Graphite monochromator
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D/teX Ultra: silicon strip detector
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HyPix-400 MF: 2D HPAD detector
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Air sensitive sample holder
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Travel case