Description
The Rigaku NEX DE Series are high-performance, direct excitation energy dispersive X-ray fluorescence (EDXRF) spectrometers that provide rapid, non-destructive qualitative and quantitative elemental analysis of sodium (Na) to uranium (U) with small spot analysis capabilities. NEX DE Series analyzers serve a broad range of applications and industries and are ideal for measuring low ppm levels up to high weight percent concentrations. They are well-suited for exploration, research, bulk RoHS inspection, education, forensics, and industrial and production monitoring applications.
NEX DE Series spectrometers deliver high-performance results when analysis time or sample throughput is critical. They have a 60 kV, 12 W X-ray tube, single and multilayer tube filters, and a high-performance silicon drift detector (SDD) that supports count rates over 500K cps. The high-count rates provide low limits of detection and excellent spectral resolution, and high-throughput measurements are obtained with various interchangeable automatic sample changers. These features enable the NEX DE Series to deliver the highest precision analytical results in the shortest possible measurement times. Additionally, NEX DE Series feature QuantEZ software designed to maximize time for its users. The intuitive instrument control, simple menu navigation, and EZ Analysis interface simplify routine operations and allow operators to create new applications using a simple flow bar wizard.
For small spot analysis needs, the NEX DE VS model features a high-resolution camera and automated collimators to allow for precise positioning of samples to analyze 1 mm, 3 mm, and 10 mm spot sizes. The instrument’s large sample chamber accommodates samples up to 30 cm in diameter and 10 cm tall, and the Point Analysis interface and integrated backlit camera allow easy sample positioning for small spot measurements. NEX DE VS is an excellent system for measuring coatings on smaller parts, screening small samples for electronic waste initiatives, or investigating the identification of foreign matter of unknown composition.
Whether on the plant floor or in a QC lab, the NEX DE Series analyzers provide unparalleled performance for bulk and small-spot analysis. The superior analytical power, flexibility, and ease of use add to their broad appeal for an ever-expanding range of applications, including basic quality control (QC) or its more sophisticated variants, such as analytical quality control (AQC), quality assurance (QA), or statistical process control like Six Sigma.
Key advantages and features:- Non-destructive elemental analysis for sodium (Na) to uranium (U)
- Powerful QuantEZ software
- Solids, liquids, alloys, powders, and thin films
- Unparalleled performance for bulk and small spot analysis
- 60 kV X-ray tube for wide elemental coverage
- High-performance SDD for superior data
- Multiple automated tube filters for enhanced sensitivity
- Unmatched performance-to-price ratio
- Optional RPF-SQX Fundamental Parameters featuring Scattering FP