Description
The EDX-LE is an energy dispersive X-ray fluorescence spectrometer designed specifically for screening elements regulated by RoHS/ELV directives. Its detector (Si-PIN semiconductor detector) does not require liquid nitrogen, thereby achieving lower operational costs and easier maintenance. Automated analysis functions improve operability without sacrificing its high level of inspection reliability.
The time required from start of measurement to judgment is as short as one minute for some samples, which is very helpful in screening inspections for elements regulated by the RoHS directive.
Features
- Exceptional labor savings, high-speed screening
- Lower operational costs, easier maintenance
- Provides specific functions for screening the five RoHS regulated elements
- Easy set-up functions can be customized according to the management method
- Easily carry out difficult tasks
- Easy operation from the [Screening Analysis] window
- All steps are automatically set, from the evaluation of major components to selection of conditions
- All necessary functions are provided
- Functions necessary for RoHS/ELV analysis are provided as standard
- A large sample chamber enables measurements of large samples