Comprehensive Profiling of Environmental Contaminants in Surface Water Using High-Resolution GC/Q-TOF from Agilent

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ItemComprehensive Profiling of Environmental Contaminants in Surface Water Using High-Resolution GC/Q-TOF
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(231) The identification of abrasive grains in the decohesion process by acoustic emission signal patternsThe International Journal of Advanced Manufacturing TechnologyOctober 1, 2016PaweÅ‚ Sutowski, Krzysztof NadolnyLondon Limited. ISBN: 978-1-84628-328-4 32. Hewlett Packard (2000) The fundamentals of signal analysis. Application note 243. Agilent Technologies. Hewlett Packard Intercontinental. URI: http://cp.literature.agilent.com/litweb/pdf/ 5952-8898E.pdf 33.

(232) THz Frequency Up-Conversion using Superconducting Tunnel JunctionIEEE Microwave and Wireless Components LettersOctober 1, 2016Hawal Rashid, Vincent Desmaris, Alexey Pavolotsky, Victor BelitskyGHz Band," Terahertz Science and Technology, IEEE Transactions on, vol. 3, pp. 416421, 2013. Agilent Application Note 150.

(233) Dissolved air flotation and centrifugation as methods for oil recovery from ruptured microalgal cellsBioresource TechnologyOctober 1, 2016Forough Ghasemi Naghdi, Peer M. SchenkDB-Wax column (Agilent, 122-7032) was used with running conditions as described in Agilent’s RTL DBWax method (Application note: 5988-5871EN; David et al., 2002). Identification of FAMEs was based on mass spectral profiles and retention

(234) Application of a Dual-Arm Robot in Complex Sample Preparation and Measurement ProcessesSLAS TechnologyOctober 1, 2016Heidi Fleischer, Robert Ralf Drews, Jessica Janson, Bharath Reddy Chinna Patlolla, Xianghua Chu, Michael Klos, Kerstin Thurow155–162. 39. Langlois, J.; Kuipers, J. Fast GC Analysis of Natural Waxes from Art and Museum Objects. Application Note SI-02454. Waldbronn, Germany: Agilent Technologies, 2010. http:// www.chem.agilent.com/Library/applications/SI-02454.pdf. 40.

(235) Development of Coupler for Live Cable Fault Detection Based on ReflectometryJournal of the Korea Academia-Industrial cooperation SocietySeptember 30, 2016Jeong-Chay Jeon, Hun Oh“Time Domain S-parameters,” July 2009. Reflectometry(TDR) [2] Agilent, “Time Domain Reflectometry Application Note 1304-2,” May 10, 2006. [정회원] •1993년 8월 : 원광대학교 대학원 전기공학과 (공학석사) •1997년 8월 : 원광대학교 대학원 전기공학과 (공학박사) •2011년

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Comprehensive Profiling of Environmental Contaminants in Surface Water Using High-Resolution GC/Q-TOF from Agilent

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Agilent Technologies

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