Short Chain Chlorinated Paraffins (SCCP) Analysis Using Negative Chemical Ionization (CI) and Low Energy EI by High-Resolution 7250 GC/Q-TOF from Agilent

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ItemShort Chain Chlorinated Paraffins (SCCP) Analysis Using Negative Chemical Ionization (CI) and Low Energy EI by High-Resolution 7250 GC/Q-TOF
CompanyAgilent Technologies
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(213) Measuring High Surface Temperature in Concentrated Solar Radiation EnvironmentsAmerican Journal of Engineering and Technology ManagementJanuary 1, 2017JesÃºs BallestrÃnEnergy Engineering 123 (2001) 164-170. [25] Agilent Technologies, Practical Temperature Measurements, 1980, Application Note 290. [26] H. Baker, E. Ryder, N. Baker, Temperature measurement in engineering. Omega Press, Stamford,

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(215) HPLC APPLICATION WITH AMPEROMETRIC DETECTIONAnalyticsJanuary 1, 2017A. Yashin, A. Vedenin, Ya. Yashinmultielectrode electrochemical detection // Agilent Technologies. electrochemical detection // Journal of Chromatogra- Application Note (A, B6, C, D3, E). 1991. Pub. Num. phy A. 1995. V. 697. P. 357–362. 80. Fernando A., Mohammed Z., Gregorio

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Short Chain Chlorinated Paraffins (SCCP) Analysis Using Negative Chemical Ionization (CI) and Low Energy EI by High-Resolution 7250 GC/Q-TOF from Agilent

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Agilent Technologies

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