Short Chain Chlorinated Paraffins (SCCP) Analysis Using Negative Chemical Ionization (CI) and Low Energy EI by High-Resolution 7250 GC/Q-TOF from Agilent

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ItemShort Chain Chlorinated Paraffins (SCCP) Analysis Using Negative Chemical Ionization (CI) and Low Energy EI by High-Resolution 7250 GC/Q-TOF
CompanyAgilent Technologies
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(342) Monitoring the production of FRP composites: A review of in-line sensing methodsExpress Polymer LettersJanuary 1, 2014S. Konstantopoulos, E. Fauster, R. Schledjewski444– 475 (2003). DOI: 10.2136/vzj2003.4440 [21] Agilent Technologies: Time domain reflectometry theory. Application note (2014). [22] Pandey G., Deffor H., Thostenson E. T., Heider D.: Smart tooling with integrated time domain

(343) Novel power MOSFET-based expander for high frequency ultrasound systemsUltrasonicsJanuary 1, 2014Hojong Choi, K. Kirk ShungIRE. 32(7):419–422, 1944. 26. Three methods of noise figure measurement. Agilent Technologies Inc.,Application Note. 2875:2003. 27. Choi H, Yang H-C, Lau S-T, Zhou Q, Shung KK. Novel limiter using biploar power transistors

(344) Shielding Effectiveness of Ceramic Bodies Produced with Natural ZeoliteActa Physica Polonica AJanuary 1, 2014B. KanberoÄŸlu, A. ÅžÃ¼kran DemirkÄ±ranAgilent Solutions for Measuring Permittivity and Permeability with LCR Meters and Impedance Analyzers, Application Note 1369-1 (2008). [10] C.A. Balanis, Advanced Engineering Electromagnetics, Wiley, USA 1989, p. 42.

(345) A Data Structure for Rapid Mass Spectral SearchingMass Spectrom (Tokyo)January 1, 2014Daniel L. SweeneyJosefsson, M. Roman. “Rapid and Accurate Forensics Analysis using High Resolution Ions MS/MS,” Agilent Application Note, http://www.chem.agilent.com/Library/applications/5991-2319EN. pdf J. L. Little, A. J. Williams, A.

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Short Chain Chlorinated Paraffins (SCCP) Analysis Using Negative Chemical Ionization (CI) and Low Energy EI by High-Resolution 7250 GC/Q-TOF from Agilent

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