Increasing Productivity in Pesticide Residue Analysis Using JetClean with GC/MS and StreamSelect with LC/MS Systems from Agilent

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ItemIncreasing Productivity in Pesticide Residue Analysis Using JetClean with GC/MS and StreamSelect with LC/MS Systems
CompanyAgilent Technologies
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(211) Atmospheric-pressure solution-cathode glow discharge: A versatile ion source for atomic and molecular mass spectrometryAnalytica Chimica ActaJanuary 15, 2017Andrew J. Schwartz, Kelsey L. Williams, Gary M. Hieftje, Jacob T. Shelley(2016). [21] G. Wells, H. Prest, C.R. Russ, Signal, Noise, and Detection Limits in Mass Spectrometry, Application Note, Agilent Technologies, 2011. [22] F.J. Andrade, J.T. Shelley, W.C. Wetzel, M.R. Webb, G. Gamez, S.J.

(212) A dilute-and-shoot flow-injection tandem mass spectrometry method for quantification of phenobarbital in urineRapid Communications in Mass SpectrometryJanuary 15, 2017Ravali Alagandula, Xiang Zhou, Baochuan GuoR. Fu, A. Zhai. Analyze barbiturates in urine with Agilent 6430 LC/MS/MS and Poroshell 120 EC-C18. Application Note: 5991-2596EN, Agilent Technologies, Inc. [15] X. Xie, M. Gao, M. Kozak. A simple method to analyze barbiturates

(213) An Experiment and Detection Scheme for Cavity-Based Light Cold Dark Matter Particle SearchesAdvances in High Energy PhysicsJanuary 1, 2017Masroor H. S. Bukhari, Zahoor H. ShahCalif, USA, 2012. [31] Agilent Technologies, “Low-noise amplifiers using ATF55143 low-noise PHEMT,” Application Note 1285, Agilent Technologies, San Jose, Calif, USA, 2002. [32] J. V. Dilorenzo, B. D. Lauterwasser, and

(214) Measuring High Surface Temperature in Concentrated Solar Radiation EnvironmentsAmerican Journal of Engineering and Technology ManagementJanuary 1, 2017JesÃºs BallestrÃnEnergy Engineering 123 (2001) 164-170. [25] Agilent Technologies, Practical Temperature Measurements, 1980, Application Note 290. [26] H. Baker, E. Ryder, N. Baker, Temperature measurement in engineering. Omega Press, Stamford,

(215) Atomic Force Microscopy for Collagen-Based NanobiomaterialsJournal of NanomaterialsJanuary 1, 2017Andreas StylianouTechnologies, 2014. [43] W. Han and F. M. Serry, Force Spectroscopy with the Atomic Force Microscope—Application Note, Agilent Technologies, 2008. [44] M. Stolz, R. Raiteri, A. U. Daniels, M. R. VanLandingham, W. Baschong,

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Increasing Productivity in Pesticide Residue Analysis Using JetClean with GC/MS and StreamSelect with LC/MS Systems from Agilent

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Agilent Technologies

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