Workflow Solutions for Direct Insertion, Real-Time Gas Chromatography -Mass Spectrometry from Agilent

Product Details
ItemWorkflow Solutions for Direct Insertion, Real-Time Gas Chromatography -Mass Spectrometry
CompanyAgilent Technologies
PriceGet Quote
Catalog NumberApplication Note

Add to Compare List

See More White Paper DL

Agilent Technologies

5301 Stevens Creek Blvd

Santa Clara, CA 95051

United States

Phone: +1 877-424-4536

Company Profile

Website: www.agilent.com

(371) Jitter impact on clock distribution in LHC experimentsJournal of InstrumentationDecember 20, 2012S Baron, T Mastoridis, J Troska, P BaudrenghienCavity voltage phase modulation MD, LHC MD technical note, ATS-Note-2012-XXX MD (July 2012). [6] Agilent Application Note, Using clock jitter analysis to reduce BER in serial data applications, Agilent Technologies Application Note

(372) Radio frequency IDentification miniature interrogator antenna sprayed over an in-vehicle chassisIET Microwaves, Antennas & PropagationDecember 11, 2012I.J. Garcia Zuazola, J.M.H. Elmirghani, A. Perallos, I. Angulo, R. Langley, A. Sharma, J.C. Batchelor, W.G. Whittowhttps://www.clippercontrols.com/pages/dielectric-constant-values#P [8] Basics of Measuring the Dielectric Properties of Materials, Application Note, Agilent Technologies, June 26, 2006, available [online] at cp.literature.agilent.com/litweb/pdf/5989-2589EN.pdf [9]

(373) Resistive Graphene FET Subharmonic Mixers: Noise and Linearity AssessmentIEEE Transactions on Microwave Theory and TechniquesDecember 1, 2012Michael A. Andersson, Omid Habibpour, Josip Vukusic, Jan Stake6, pp. 2653-2657, Jun. 2011. [25] “Noise Figure Measurement Accuracy - The Y-Factor Method,” Agilent Application Note, 2010, 57-2. [26] S. A. Maas, “A GaAs MESFET Mixer with Very Low Intermodulation,” IEEE Transactions

(374) Long-Range Channel Measurements on Small Terminal Antennas Using OpticsIEEE Transactions on Instrumentation and MeasurementOctober 1, 2012B. Yanakiev, Jesper Odum Nielsen, M. Christensen, G. F. Pedersen2006. [22] Fundamentals of RF and Microwave Noise Figure Measurements, Agilent Technologies, Inc., May 2010, Application Note 57-1. [Online]. Available: http://cp.literature.agilent.com/litweb/pdf/5952-8255E.pdf [23] Microcoaxial

(375) Novel Reflectometry Method Based on Time Reversal for Cable Aging Characterization2012 IEEE 58th Holm Conference on Electrical Contacts (Holm)September 1, 2012Lola El Sahmarany, Fabrice Auzanneau, Pierre Bonnetspeech, and signal processing, vol. Asp-29, no. 5, October 1981. [21] “Time domain reflectometry theory,” Application Note 1304-2, Agilent Technologies, www.agilent.com, Aug. 2002.

Be the First to Write a Review!

Workflow Solutions for Direct Insertion, Real-Time Gas Chromatography -Mass Spectrometry from Agilent

Company Info

Agilent Technologies

Citations (478)

Be the First to Write a Review!