Description
ParticleScout is an advanced particle analysis tool for witec360 Raman microscopes that finds, classifies and identifies microparticles over even large sample areas.
User-defined categorization of particles by shape and size offers access to wide-ranging properties, and the results of the measurement are then presented in a report that provides a comprehensive description of the sample.
ParticleScout features the most flexible and useful sample survey capabilities available.
- White-light Microscopy: Bright field/dark field, transmission/reflection.
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Image Stitching: Scans of many sample areas can be combined into one measurement for a large-area overview of widely distributed particles.
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Focus Stacking: This unique capability dramatically increases the depth of focus for sharp and defined particle imaging.
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Integration time optimisation – reduces measurement time and minimizes the effects of fluorescence.
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Vignetting correction – ensures uniform brightness throughout the image plane.
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Smart zoom – displays particle information dynamically depending on viewed area.
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Sample area targeting – allows the selection of multiple regions of interest for each investigation.
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Dark-field, bright-field, epifluorescence and transmission sample illumination – provides the best option for each type of particle.
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Round sample wedge sectioning – allows the selection of an area for data acquisition, typically on a filter, that can be extrapolated to represent the whole.
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Smart separation of particles – differentiates materials in densely packed, heterogeneous samples.
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• Quantitative report formatting – presents data using table, bar graph histogram and pie chart templates for ease and clarity.