RISE Microscopy – Raman Imaging-SEM from Oxford Instruments

RISE Microscopy is a novel correlative microscopy technique that combines confocal Raman Imaging and SEM to link ultra-structural surface properties with molecular compound information.

The RISE Microscope combines all features of a stand-alone SEM and the witec360 confocal Raman imaging microscope within one instrument.

• Quick and convenient switching between Raman and SEM measurement.
• Automated sample transfer from one measuring position to the other.
• Integrated software interface for user-friendly measurement control.
• Correlation of the measurement results and image overlay.
• No compromise in SEM and Raman imaging capabilities.