Fourier-Transform-Infrared (FT-IR) microscopy is a well established method for the analysis of samples that are too small or complex to be measured in a standard IR spectrometer. With FT-IR microscopy it is possible to obtain an IR-spectrum anywhere on the sample with a very high local resolution and thereby revealing the chemical composition of an extremely defined part of the sample. Learn more about  FT-IR Microscope LUMOS II in this application note.

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