JBX-3050 Focused Ion Beam Microscope from JEOL USA, Inc.

Get Quote

Get Quote from
JEOL USA, Inc. for
JBX-3050 Focused Ion Beam Microscope

Description

JEOL has more than 50 years of e-beam expertise. The JBX-3050MV series is an electron beam lithography system for mask/reticle fabrication that meets the design rule of 45 to 32 nm. This system features pattern writing with high speed, high accuracy and high reliability, achieved by high-end technology.