Tohoku University researchers have developed an entirely new elemental mapping technique which uses cryo-EELS/EF-TEM to enable simultaneous visualization of both structure, and elemental distribution of nanomaterials in frozen solvents. The new approach provides researchers with a high-resolution analysis technique for organic and bio-related materials.
In their work, published in the journal Analytical Chemistry, the researchers developed a new imaging technique which combines the 3-window method with drift compensation to overcome challenges with ice increasing background noise.
By using this technique, the researchers successfully visualized silicon distribution in silica nanoparticles contained in a frozen solvent detecting particles to as low as 10nm. Further improvements in the form of a new program tailored to the “ParallEM” electron microscope improved system control by allowing easy control of energy shifting while imaging.
If adopted, the method developed by the researchers could advance the analysis of numerous materials, including biomaterials, across a diverse array of fields ranging from life science to materials science.