Celebrating the company’s 50th anniversary, EDAX gives an overview of the exciting new technology and latest developments in Energy Dispersive Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD) and Micro-XRF tools released in 2012. The overview includes the TEAM Pegasus Analysis System for materials characterization studies for elemental analysis and crystal structure measurements; the Hikari XP EBSD Camera for hi-speed data collection that features 650 index points/sec and 100pA sensitivity; New Octane Series Silicon Drift Detectors for increased resolution that can be used for a variety of applications, such as biologics, geology, metals, semiconductors, and more; and the Orbis Micro-XRF Spectrometer for elemental analysis and imaging of samples in criminal forensics, non-destructive testing, materials, and more.