Laser diffraction particle size analyzers are used to measure the sizes of particles in a material. Particle size is calculated by measuring the angle of light scattered by the particles as they pass through a laser beam. Laser diffraction analyzers are used in many applications, including manufacturing, quality control and product development. Because this technique can continuously measure particle sizes across a wide range, from 10 nm to 3 mm, laser diffraction particle size analyzers are often used in industrial settings.
A laser diffraction particle size analyzer uses multiple light detectors, with more detector elements extending sensitivity and size limits. The time needed to measure particle sizes varies by instrument, ranging from 2 seconds to 10 minutes per sample. The light source used by a laser particle size analyzer also affects particle size measuring limits; shorter wavelength violet and UV lasers are better suited to measure submicron-sized particles than red lasers.
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| Company | Shimadzu | Shimadzu |
| Item | SALD-7500nano Particle Size Analyzer | SALD-2300 Laser Diffraction Particle Size Analyzer |
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| Catalog Number | SALD-7500nano | SALD-2300 |
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| Description | Well-suited for R&D in nanotechnology and life sciences, Shimadzu’s highly sensitive SALD-7500nano particle size analyzer can accurately measure nanoparticles in low concentrations or those that demonstrate high light absorption. The analyzer also provides real-time tracing of changes across a wide Well-suited for R&D in nanotechnology and life sciences, Shimadzu’s highly sensitive SALD-7500nano particle size analyzer can accurately measure nanoparticles in low concentrations or those that demonstrate high light absorption. The analyzer also provides real-time tracing of changes across a wide range of particle sizes.
Key features include:
- Wide measurement range, from primary particles to sub-visible (SVB) particles and contaminants
- Broad concentration range, from 0.01 ppm to 20 percent
- Enables measurement of micro bubbles from 100nm to 60µm and real-time tracking of changes in bubble diameter
- High-speed measurement to a minimum of 1 second and real-time display of particle size distribution at 1-second intervals
Functions for statistical processing and 3D display of the particle reaction processes offer multifaceted analyses and evaluations.
The system uses an omnidirectional shock absorption frame (OSAF) to improve instrument stability and provide high reproducibility, while built-in self-diagnostic functions ensure easy maintenance. A number of data analysis functions, including data emulation and mixture data simulation, provide for more efficient data processing.... Read More | The SALD-2300 Laser Diffraction Particle Size Analyzer from Shimadzu measures wet or dry materials, ensuring outstanding product quality in the pharmaceutical, food and beverage, ceramics and electronics industries. It provides continuous measurement in real time, at minimum one-second intervals, The SALD-2300 Laser Diffraction Particle Size Analyzer from Shimadzu measures wet or dry materials, ensuring outstanding product quality in the pharmaceutical, food and beverage, ceramics and electronics industries. It provides continuous measurement in real time, at minimum one-second intervals, features a measurement range that spans particle sizes from 17 nm to 2,500 µm, and enables measurements of samples at a variety of concentrations without diluting or concentrating them. The SALD-2300 comes with WingSALD II software, which is the world’s first software to automatically calculate an appropriate refractive index based on the light intensity distribution reproduction method. This function eliminates the challenges associated with selecting refractive indices.
Features:
- Provides continuous measurement in real time, at minimum one-second intervals
- Measurement range spans particle sizes from 17 nm to 2,500 µm, and users can select various sample amounts depending on measurement objectives
- Omnidirectional shock absorption frame ensures instrument stability and provides high reproducibility
- Measurement assist function reduces operation errors by allowing users to prepare SOPs
- Self-diagnostic function
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| Type | Nano, Laser diffraction and scattering | Laser Diffraction Method |
| Particle Size | 7 nm to 800 µm | 17 nm to 2,500 µm |
| Light Source | Semiconductor laser (Wavelength 405 nm) | Red Semiconductor laser (Wavelength 680 nm) |
| Measuring Time | 1 sec | 1 sec |
| Detector(s) | Wing sensor ll | Total 84 elements (78 forward, 1 side, 5 back) |
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