SEM Sample Preparation / TEM Sample Preparation

SEM and TEM sample preparation equipment are essential tools used to prepare specimens for scanning electron microscopy (SEM) and transmission electron microscopy (TEM) analysis. These instruments—such as sputter coaters, ion mills, ultramicrotomes, and plasma cleaners—ensure samples are properly thinned, cleaned, and coated for optimal imaging resolution and contrast. Choosing the right preparation tools depends on your sample type, required thickness, conductivity, and imaging goals. High-quality SEM/TEM prep equipment improves imaging accuracy, prevents artifacts, and is critical for advanced materials characterization and nanostructure analysis.
CompanyJEOL USA, Inc.JEOL USA, Inc.JEOL USA, Inc.JEOL USA, Inc.JEOL USA, Inc.
ItemCross Section PolisherEC-32010CC JEOL Carbon CoaterJII-29080DMS (Sample Holder Pre-exhaust System)miXcroscopy™ Linked Optical & Scanning Electron Microscopy SystemSmart Coater
Catalog NumberIB-19540CP / IB-19550CCPEC-32010CCJII-29080DMSmiXcroscopy™DII-29010SCTR / DII-29030SCTR
Price
TypeCross Section PolisherCarbon CoaterInquireLinked Optical & Scanning Electron Microscopy SystemSputter Coater
ApplicationsElectron microscopy sample prepA sample preparation device that evaporates carbon to create a conductive thin film on the sample surface.Holder station that holds a transmission electron microscope (TEM) sample holder in a vacuum.InquireFully automated sputter coating for imaging in a scanning electron microscope
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