SEM Sample Preparation / TEM Sample Preparation

SEM and TEM sample preparation equipment are essential tools used to prepare specimens for scanning electron microscopy (SEM) and transmission electron microscopy (TEM) analysis. These instruments—such as sputter coaters, ion mills, ultramicrotomes, and plasma cleaners—ensure samples are properly thinned, cleaned, and coated for optimal imaging resolution and contrast. Choosing the right preparation tools depends on your sample type, required thickness, conductivity, and imaging goals. High-quality SEM/TEM prep equipment improves imaging accuracy, prevents artifacts, and is critical for advanced materials characterization and nanostructure analysis.
CompanyJEOL USA, Inc.JEOL USA, Inc.JEOL USA, Inc.JEOL USA, Inc.JEOL USA, Inc.
ItemCross Section PolisherEC-32010CC JEOL Carbon CoaterEC-52000IC (Ion Cleaner)JEC-3000FC (Auto Fine Coater)miXcroscopy™ Linked Optical & Scanning Electron Microscopy System
Catalog NumberIB-19540CP / IB-19550CCPEC-32010CCEC-52000ICJEC-3000FCmiXcroscopy™
Price
TypeCross Section PolisherCarbon CoaterION CLEANERSputter CoaterLinked Optical & Scanning Electron Microscopy System
ApplicationsElectron microscopy sample prepA sample preparation device that evaporates carbon to create a conductive thin film on the sample surface.Holds a specimen of an electron microscope underglow discharge, for removing hydrocarboncontaminants adhered to the specimen byutilizing physical and chemical reactions.Fully automated sputter coating for SEM imagingInquire
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