SEM Sample Preparation / TEM Sample Preparation

SEM and TEM sample preparation equipment are essential tools used to prepare specimens for scanning electron microscopy (SEM) and transmission electron microscopy (TEM) analysis. These instruments—such as sputter coaters, ion mills, ultramicrotomes, and plasma cleaners—ensure samples are properly thinned, cleaned, and coated for optimal imaging resolution and contrast. Choosing the right preparation tools depends on your sample type, required thickness, conductivity, and imaging goals. High-quality SEM/TEM prep equipment improves imaging accuracy, prevents artifacts, and is critical for advanced materials characterization and nanostructure analysis.
CompanyJEOL USA, Inc.JEOL USA, Inc.
ItemEC-52000IC (Ion Cleaner)EC-32010CC JEOL Carbon Coater
Catalog NumberEC-52000ICEC-32010CC
Price
TypeION CLEANERCarbon Coater
ApplicationsHolds a specimen of an electron microscope underglow discharge, for removing hydrocarboncontaminants adhered to the specimen byutilizing physical and chemical reactions.A sample preparation device that evaporates carbon to create a conductive thin film on the sample surface.
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