SEM Sample Preparation / TEM Sample Preparation

SEM and TEM sample preparation equipment are essential tools used to prepare specimens for scanning electron microscopy (SEM) and transmission electron microscopy (TEM) analysis. These instruments—such as sputter coaters, ion mills, ultramicrotomes, and plasma cleaners—ensure samples are properly thinned, cleaned, and coated for optimal imaging resolution and contrast. Choosing the right preparation tools depends on your sample type, required thickness, conductivity, and imaging goals. High-quality SEM/TEM prep equipment improves imaging accuracy, prevents artifacts, and is critical for advanced materials characterization and nanostructure analysis.
CompanyJEOL USA, Inc.JEOL USA, Inc.JEOL USA, Inc.JEOL USA, Inc.JEOL USA, Inc.
ItemEC-52000IC (Ion Cleaner)Cross Section PolisherEC-32010CC JEOL Carbon CoaterJEC-3000FC (Auto Fine Coater)Smart Coater
Catalog NumberEC-52000ICIB-19540CP / IB-19550CCPEC-32010CCJEC-3000FCDII-29010SCTR / DII-29030SCTR
Price
TypeION CLEANERCross Section PolisherCarbon CoaterSputter CoaterSputter Coater
ApplicationsHolds a specimen of an electron microscope underglow discharge, for removing hydrocarboncontaminants adhered to the specimen byutilizing physical and chemical reactions.Electron microscopy sample prepA sample preparation device that evaporates carbon to create a conductive thin film on the sample surface.Fully automated sputter coating for SEM imagingFully automated sputter coating for imaging in a scanning electron microscope
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