Inductively coupled plasma mass spectrometers (ICP-MS) utilize inductively coupled plasma for sample ionization and an MS for ion separation and quantification. The low detection limits and high productivity possible with ICP-MS are particularly useful for trace metal analysis and environmental testing. Common components of an ICP-MS system include a sample introduction system, an ion source, a vacuum system, a collision reaction cell, ion optics, a mass spectrometer (often a quadrupole), and a detector. An analytical working range of nine orders of magnitude, detection limits below the ppt range, and aptitude for isotopic analysis are hallmarks of ICP-MS. ICP-MS instruments are commonly configured for routine analyses, high-matrix interference samples, or specific applications, such as work in the semiconductor industry or medical and forensic toxicology fields. Also, be sure to consider any desired customization options, such as chromatographic coupling or use with organic solvents.
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| Company | Nu Instruments | Nu Instruments |
| Item | Attom ES ICP-MS | Nu Sapphire XD MC-ICP-MS/MS |
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| Description | The Attom ES is a double-focusing, single-collector HR-ICP-MS with the analyser and sample introduction system at ground potential. It uses a laminated magnet with FastScan electrostatic deflector optics to cover up to 40% of a given mass range without changing the magnetic field. A unique patented The Attom ES is a double-focusing, single-collector HR-ICP-MS with the analyser and sample introduction system at ground potential. It uses a laminated magnet with FastScan electrostatic deflector optics to cover up to 40% of a given mass range without changing the magnetic field. A unique patented detector attenuation system extends the pulse-counting multiplier to 9 orders of magnitude dynamic range; an optional Faraday detector extends this to 12 orders.... Read More | Sapphire XD is a dual-path MC-ICP-MS/MS that extends the Sapphire platform with a fully retractable Double Wien mass filter (permanent magnets + lens field arrays) and an Xtra Dispersion (XD) fixed collector array. The mass filter can be inserted prior to the hexapole collision/reaction cell for MS/Sapphire XD is a dual-path MC-ICP-MS/MS that extends the Sapphire platform with a fully retractable Double Wien mass filter (permanent magnets + lens field arrays) and an Xtra Dispersion (XD) fixed collector array. The mass filter can be inserted prior to the hexapole collision/reaction cell for MS/MS operation (e.g. Rb-SrF mass shifting) or used alone to suppress space-charge effects. The XD collector provides 25% natural dispersion and accommodates up to 28 Faraday cups and 6 ion-counting detectors.... Read More |
| Optical System | Double-focusing magnetic sector (electrostatic analyser + laminated magnet); forward Nier-Johnson geometry; ground-potential analyser; FastScan electrostatic deflector optics covering up to 40% of mass range; three fixed-slit resolution modes: low (~300 M/?M), medium (~4,000 M/?M), high (>10,000 M/?M) | Double-focusing magnetic sector; dual-path transfer optics (high-energy path and low-energy path with hexapole CRC); fully retractable Double Wien mass filter (permanent magnets + lens field arrays); variable-dispersion Zoom Optics; Enhanced Sensitivity Interface as standard; up to 4 mass-flow-controlled reaction gas inlets; software-selectable standard, medium, and high-resolution modes |
| Mass Analyzer | Single-collector double-focusing magnetic sector; mass range 1–260 u | Multi-collector double-focusing magnetic sector with MS/MS capability; XD collector array with up to 28 Faraday cups + up to 6 ion-counting detectors (SEM or Daly); mass range Li to U and beyond; 25% natural dispersion; dynamic range 0–75 Gcps (SEM to 10^10 O pre-amplifier) |
| Dynamic Range | 9 orders of magnitude (pulse-counting multiplier with patented beam attenuation); 12 orders of magnitude with optional Faraday detector | 0–75 Gcps (0–1200 V) from SEM to 10^10 O resistor pre-amplifier |
| Applications | Laser ablation imaging, nanoparticle analysis, isotope ratio measurements, trace element quantification, nuclear analysis, geochemistry, environmental monitoring | Geochronology (Rb-Sr, Lu-Hf, Re-Os, U-Th-Pb), stable isotope analysis (Mg, Si, S, K, Ca, Ti, V, Cr, Fe, Ni, Se), laser ablation in situ dating, nuclear safeguarding, environmental monitoring, forensics, life sciences |
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