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| Company | Park Systems Inc | Park Systems Inc |
| Item | PointProbe Plus (PPP) Non-Contact AFM Probes | SuperSharpSilicon (SSS) Non-Contact AFM Probes |
| Citations | | |
| Catalog Number | PPP-NCHR, PPP-NCH, PPP-NCLR, PPP-NCL | SSS-NCHR, SSS-NCH, SSS-NCLR, SSS-NCL |
| Price | Inquire | Inquire |
| Description | The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution. These probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.
Features:
- guaranteed tip radius of curvature < 10 nm
- highly doped to dissipate static charge
- high mechanical Q-factor for high sensitivity
... Read More | NANOSENSORS™ SuperSharpSilicon (SSS) AFM tips are designed for non-contact mode or Tapping Mode AFM. For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.
Features:
- guaranteed tip radius of curvature < 5 nm
- typical tip radius of
NANOSENSORS™ SuperSharpSilicon (SSS) AFM tips are designed for non-contact mode or Tapping Mode AFM. For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.
Features:
- guaranteed tip radius of curvature < 5 nm
- typical tip radius of curvature of 2 nm
- typical aspect ratio at 200 nm from tip apex in the order of 4:1
- half cone angle at 200 nm from apex < 10°
- monolithic material
- highly doped to dissipate static charge
- chemically inert
- high mechanical Q-factor for high sensitivity
The SSS-NCLR is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum cantilever length > 125 µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.
The SSS-NCL is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum cantilever length > 125 µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.... Read More |
| Material | Aluminum Coated | Silicon |
| Tip Measurement | 3 to 5 µm or 6 to 8 µm | 3 to 5 µm or 6 to 8 µm |
| Cantilever Length | 115 to 135 µm or 215 to 235 µm | 115 to 135 µm or 215 to 235 µm |
| Force Constant | 42 to 48 N/m | 42 to 48 N/m |
| Resonant Frequency | 190 to 330 kHz | 190 to 330 kHz |
| Type | Non-Contact AFM | Non-Contact AFM |
| Get Quote | Inquire | Inquire |