Atomic force microscopes (AFMs), or scanning force microscopes, provide a high-resolution 3-D surface profile using a cantilever with a sharp tip to scan the surface to be imaged. AFM measures the deflection of the lever, not the force itself, with most systems using a laser beam deflection system. Scanning ranges of 1–100 µm are typical. AFM’s ability to image almost any type of surface, including biological samples, polymers, ceramics, and glass, with little sample preparation, lends it toward use in nanotechnology, the life sciences, electrochemistry, and materials science.
Modes of operation include contact mode; noncontact mode, which minimizes sample damage; force modulation; and tapping mode, which makes use of a piezoelectric element to vibrate the cantilever. Interesting features include dual-lens optics for nano education, easy tip exchange without laser adjustment, passive or active vibration isolation to eliminate noise, and systems optimized to measure larger samples.
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WITec GmbH
- 100 x 100 x 20 um
- Contact Mode or Lateral Force, Pulsed Force, AC-Mode or Phase Imaging, Magnetic Force, Nanolithography or Nanomanipulation
WITec GmbH
- 50 x 100 mm to 200 x 200 mm (Scan Range X/Y), 10 mm / 20 µm (Scan Range Z)
- Confocal+P6l Raman Microscopy and Imaging, Confocal Microscopy, Atomic Force Microscopy
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