Scanning Electron Microscopes (SEM)

Scanning Electron Microscopes (SEM)

How Does a Scanning Electron Microscope Work?

A scanning electron microscope (also commonly abbreviated as SEM) uses beams of electrons to create magnified images of samples, as opposed to beams of light that a traditional microscope uses. SEMs use electrons that are bounced off near the surface region of a sample. Because the wavelength of electrons is notably smaller than that of light, the resolution of SEMs is greatly superior to that of a light microscope.

What Are Scanning Electron Microscopes Used For?

Because the SEM can magnify a sample up to 500,000 times its normal size and determine its chemical makeup, scanning electron microscopes have a wide range of applications. They are used for quality control in both the pharmaceutical and semiconductor industries, sample comparisons in forensics, diagnostics in medical labs, and in research labs to determine the composition of samples treated in different ways.

What Types of Scanning Electron Microscopes Are There?

Scanning electron microscopes have different kinds of signal detectors available that include back-scattered electrons (for imaging), characteristic X-rays (for determining types and amounts of elements present in the sample), transmitted electrons, and cathodoluminescence. Other variations in different scanning electron microscopes include availability of low or high vacuum mode and imaging options for bright field samples and/or dark field samples.

Check out this article "Integrated SEM Workflow Creates Powerful 'Nano-lab' " to see more ways in which SEM can be a valuable tool for your lab.


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JAMP-9510F Field Emission Auger Microprobe
JEOL USA, Inc.
  • Applications:
    Enables precise chemical bonding state analysis and compositional mapping, making it indispensable for researchers and engineers in materials science, nanotechnology, and related fields.?
  • Detector(s):
    Multi-channel detection
JCM-7000 NeoScope Benchtop SEM
JEOL USA, Inc.
  • Total Magnification:
    Inquire
  • Applications:
    Provides outstanding SEM images and elemental analysis results in minutes
  • Detector(s):
    Backscattered electron detector
JIB-PS500i FIB-SEM
JEOL USA, Inc.
  • Total Magnification:
    Inquire
  • Applications:
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  • Detector(s):
    Secondary electron detector (SED), Upper electron detector (UED), In-lens backscattered electron detector (iBED)
JSM-IT210 SEM
JEOL USA, Inc.
  • Total Magnification:
    Inquire
  • Applications:
    Compact stationary scanning electron microscope, embedded EDS, live analysis, heat-sensitive specimens, element maps
  • Detector(s):
    Small area EDS detector
JSM-IT510 Analytical SEM
JEOL USA, Inc.
  • Total Magnification:
    Inquire
  • Applications:
    Live analysis, simple EDS, high and low vacuum.
  • Detector(s):
    Accommodates a wide variety of detectors and accessories such as: EDS, WDS, EBSD, CL, STEM, heating/cooling substages etc.
JSM-IT710 High Resolution Large Chamber SEM
JEOL USA, Inc.
  • Total Magnification:
    Inquire
  • Applications:
    High spatial resolution imaging and analysis
  • Detector(s):
    Quadrant BSE
JSM-IT810 Ultrahigh Resolution Field Emission SEM Series
JEOL USA, Inc.
  • Total Magnification:
    Inquire
  • Applications:
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  • Detector(s):
    Semiconductor type BSE detector
JXA-iHP200F Field Emission Electron Probe Micro-Analyzer
JEOL USA, Inc.
  • Total Magnification:
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  • Applications:
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  • Detector(s):
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JXA-iSP100 Electron Probe Micro-Analyzer
JEOL USA, Inc.
  • Total Magnification:
    Inquire
  • Applications:
    High-resolution imaging, quantitative elemental analysis, and chemical state analysis
  • Detector(s):
    Inquire
NeoScope™ Benchtop SEM JCM-7000
JEOL USA, Inc.
  • Total Magnification:
    Inquire
  • Applications:
    Materials characterization, eds analysis, elemental analysis, SEM images
  • Detector(s):
    Backscattered electron detector
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