| Description | An easy to use benchtop SEM with advanced features of full-sized SEMs. User can easily navigate from an optical image to high resolution SEM imaging and further analysis, set automatic conditions based on sample type and application, ensuring high quality results and enhanced productivity. ProducesAn easy to use benchtop SEM with advanced features of full-sized SEMs. User can easily navigate from an optical image to high resolution SEM imaging and further analysis, set automatic conditions based on sample type and application, ensuring high quality results and enhanced productivity. Produces images of exceptional fidelity. Simple to use for any skill level to obtain outstanding SEM images and elemental analysis results in minutes.
Features: - Large specimen chamber
- Secondary and backscatter electron detectors
- Real-time 3D imaging
- Option to add a fully embedded EDS with real-time, ‘Live’ analysis
- High resolution (100,000X) and large depth of field
- Selectable kV modes
Benefits: - View EDS spectra in real time as you search for the area of interest.
- Highly-advanced Auto functions for automatic condition setting and image formation in minutes
- High and low vacuum modes for managing a wide variety of samples
... Read More | The JAMP-9510F offers the highest spatial resolution available in an Auger microprobe: (min. probe diameter of 3nm SEI; 8nm for Auger analysis). Employing a low-aberration condenser lens (in which an electrostatic field and a magnetic field are superposed), combined with a patented "in-lens' The JAMP-9510F offers the highest spatial resolution available in an Auger microprobe: (min. probe diameter of 3nm SEI; 8nm for Auger analysis). Employing a low-aberration condenser lens (in which an electrostatic field and a magnetic field are superposed), combined with a patented "in-lens' Schottky field emission gun, the JAMP-9510F obtains very small spot sizes with beam currents up to 200nA.
Key Features
- 3nm SEI resolution
- 8nm probe diameter for Auger analysis
- Variable energy resolution from 0.05% to 0.6%
- Chemical state analysis in several 10nm areas
- Neutralizing gun allows Auger analysis of insulating materials
- Large specimen stage - samples up to 95mm in diameter
... Read More | This 4th generation Neoscope incorporates advanced technology and functions that make it simple for users at any skill level to obtain outstanding SEM images and elemental analysis results in minutes. It is equipped with a large chamber, high and low vacuum modes, secondary and backscatter electron This 4th generation Neoscope incorporates advanced technology and functions that make it simple for users at any skill level to obtain outstanding SEM images and elemental analysis results in minutes. It is equipped with a large chamber, high and low vacuum modes, secondary and backscatter electron detectors, real-time 3D imaging, highly-advanced auto functions and the option to add a fully embedded EDS with real-time, ‘Live’ analysis.
This 4th generation NeoScope™ is SMART-FLEXIBLE-POWERFUL.
Smart - The latest innovations built to our benchtop platform make this SEM accessible to everyone. Seamless navigation across the sample allows you to quickly go from an optical image to high resolution SEM imaging and analysis. Automatic condition setting based on sample type and application ensures high quality results and enhances productivity. Highly-advanced auto functions generate images of exceptional fidelity.
Flexible-Choose a platform that is right for you. Add options such as our Stage Navigation System (color camera), fully-embedded EDS for elemental analysis and Smile View Map for 3D image reconstruction and surface texture analysis.
Powerful - The high resolution W filament source allows magnification up to 100,000X. A benchtop SEM with both secondary electron and backscatter electron detectors, plus high and low vacuum modes allow for the study of a wide variety of sample types. Automated montage is built-in for high resolution view over a larger area. Includes montage X-ray map with EDS option. The BSE detector supports live 3D imaging for intuitive knowledge of sample surface shape.
LIVE ANALYSIS
Our analytical model includes JEOL’s fully embedded EDS system which provides real time EDS spectra during image observation. With Live Analysis you can:
- View EDS spectra in real time as you search for the area of interest.
- Set analysis points, areas, map position and line scan from the live image observation screen.
- View major elements as displayed on the live EDS window.
... Read More | InTouchScope™ SEM Series
The JSM-IT510 InTouchScope™ SEM Series delivers the highest level of intelligent technology with built-in automation for the most versatile analytical SEM available today.
Smart – Flexible – Powerful - Smart – The latest innovations with our InTouchScope™ series SEMs make
InTouchScope™ SEM Series
The JSM-IT510 InTouchScope™ SEM Series delivers the highest level of intelligent technology with built-in automation for the most versatile analytical SEM available today.
Smart – Flexible – Powerful - Smart – The latest innovations with our InTouchScope™ series SEMs make them accessible at every level. JEOL’s Intelligent Technology delivers seamless navigation from optical to SEM imaging, Live EDS both spectrum and X-ray maps and the best auto functions from alignment to focus for fast, clear, and sharp images. We’ve taken it to the next level with Simple SEM, built-in automation for image collection at multiple locations and conditions. Simple SEM simplifies workflow for the most routine tasks. Our embedded Signal Depth display enhances understanding of analytical spatial resolution. All this technology packed into a compact platform for unprecedented ease-of-use.
- Flexible – Choose a platform that is right for you. We offer high vacuum and low vacuum models with or without our Live (embedded) EDS system. [JSM-IT510, JSM-IT510A, JSM-IT510LV, JSM-IT510LA]. This SEM series is equipped with a large specimen chamber that accommodates a wide variety of detectors and accessories such as: EDS, WDS, EBSD, CL, STEM, heating/cooling substages etc.
- Powerful – High resolution W filament source (LaB6 option) with unsurpassed low kV performance. The JSM-IT510 includes a large analytical chamber and stage. The stage is mounted inside the chamber enabling users to secure large, heavy and odd shaped objects on the stage with clear positioning prior to evacuating the chamber.
Zeromag, with our integrated color camera allows for intuitive navigation to the area of interest and seamless transition to SEM imaging and analysis. All data is linked for instant view of analysis locations. Our new high sensitivity quadrant BSE detector can provide a Live 3D surface reconstruction enhancing your view of specimens with complex topography such as a fracture surface, plating defect, etc. Analytical models include JEOL’s fully embedded EDS system for Real-Time, Live EDS spectra and Live X-ray maps.
... Read More | The JEOL IT810 Ultrahigh Resolution Field Emission SEM is a revolutionary FE-SEM with the most advanced high-resolution analytical technology available today. Versatility and high spatial resolution meet automation and ease of use with the JSM-IT810 series FE SEM. The JEOL IT810 series offers the The JEOL IT810 Ultrahigh Resolution Field Emission SEM is a revolutionary FE-SEM with the most advanced high-resolution analytical technology available today. Versatility and high spatial resolution meet automation and ease of use with the JSM-IT810 series FE SEM. The JEOL IT810 series offers the next level of analytical intelligence for high spatial resolution imaging and analysis at the nanoscale.
- Smart - The IT810 series of Schottky Field Emission SEMs with embedded JEOL Energy Dispersive X-ray Spectrometers (EDS) streamlines operation and workflow efficiency. Elegant functionality, ultrahigh resolution, and powerful software with automation enable seamless acquisition of data from observation to elemental analysis and subsequent reporting.
The JEOL NEOENGINE® electron beam control system and advanced auto functions provide fast transitions between high resolution imaging and high current analyses, without sacrificing performance, resulting in unprecedented ease of use. Advanced algorithms optimize control of electron lenses in real time, correct electron trajectories and automatically align the beam, and correct the focus, brightness/contrast, and astigmatism. JEOL’s Live EDS analysis allows direct monitoring of specimen chemical composition during imaging.
The JEOL SEM seamlessly integrates optical imaging and navigation, SEM imaging, and EDS Live analysis and mapping with one-click operation.
- Flexible - The JSM-IT810 series is equipped with a large specimen chamber that accommodates a wide variety of detectors simultaneously, including: multiple EDS, WDS, EBSD, STEM, BSE, and CL. JEOL’s GatherX windowless EDS detector is ideal for higher sensitivity and spatial resolution with lower energy x-ray detection down to Li. JEOL’s unique Soft X-ray Emission Spectrometer (SXES) allows efficient and parallel collection of very low-energy X-rays while providing unprecedented chemical state analysis.
- Powerful - The IT810 is JEOL’s flagship FE SEM with up to 2,000,000X magnification and an accelerating voltage range of 0.01 to 30kV, making it possible to acquire stunning details of nanostructures and comprehensive analysis. This highly versatile, easy-to-use field emission SEM offers the next level of analytical intelligence in FE-SEM.
Innovative No-code Automation
The intuitive and customizable software interface makes it very easy to achieve high throughput in everyday observation and analysis, including new no code automated workflows which come standard with every IT810 series microscope.
NeoAction:
New no code automation workflows allow a novice user to set up a series of images and analyses to be completed without user intervention. Imaging and analysis can be completed with multiple beam and scan settings, stage coordinates, and detectors.
Montage:
Automated imaging and analysis of large areas including stitching together large canvases.
... Read More |
| Applications | Materials characterization, eds analysis, elemental analysis, SEM images | Enables precise chemical bonding state analysis and compositional mapping, making it indispensable for researchers and engineers in materials science, nanotechnology, and related fields.? | Provides outstanding SEM images and elemental analysis results in minutes | Live analysis, simple EDS, high and low vacuum. | Inquire |