How Does a Scanning Electron Microscope Work?
A scanning electron microscope (also commonly abbreviated as SEM) uses beams of electrons to create magnified images of samples, as opposed to beams of light that a traditional microscope uses. SEMs use electrons that are bounced off near the surface region of a sample. Because the wavelength of electrons is notably smaller than that of light, the resolution of SEMs is greatly superior to that of a light microscope.
What Are Scanning Electron Microscopes Used For?
Because the SEM can magnify a sample up to 500,000 times its normal size and determine its chemical makeup, scanning electron microscopes have a wide range of applications. They are used for quality control in both the pharmaceutical and semiconductor industries, sample comparisons in forensics, diagnostics in medical labs, and in research labs to determine the composition of samples treated in different ways.
What Types of Scanning Electron Microscopes Are There?
Scanning electron microscopes have different kinds of signal detectors available that include back-scattered electrons (for imaging), characteristic X-rays (for determining types and amounts of elements present in the sample), transmitted electrons, and cathodoluminescence. Other variations in different scanning electron microscopes include availability of low or high vacuum mode and imaging options for bright field samples and/or dark field samples.
Check out this article "Integrated SEM Workflow Creates Powerful 'Nano-lab' " to see more ways in which SEM can be a valuable tool for your lab.
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| Company | JEOL USA, Inc. | JEOL USA, Inc. |
| Item | NeoScope™ Benchtop SEM JCM-7000 | JIB-PS500i FIB-SEM |
| Catalog Number | JCM-7000 | JIB-PS500i |
| Price | | |
| Description | An easy to use benchtop SEM with advanced features of full-sized SEMs. User can easily navigate from an optical image to high resolution SEM imaging and further analysis, set automatic conditions based on sample type and application, ensuring high quality results and enhanced productivity. ProducesAn easy to use benchtop SEM with advanced features of full-sized SEMs. User can easily navigate from an optical image to high resolution SEM imaging and further analysis, set automatic conditions based on sample type and application, ensuring high quality results and enhanced productivity. Produces images of exceptional fidelity. Simple to use for any skill level to obtain outstanding SEM images and elemental analysis results in minutes.
Features: - Large specimen chamber
- Secondary and backscatter electron detectors
- Real-time 3D imaging
- Option to add a fully embedded EDS with real-time, ‘Live’ analysis
- High resolution (100,000X) and large depth of field
- Selectable kV modes
Benefits: - View EDS spectra in real time as you search for the area of interest.
- Highly-advanced Auto functions for automatic condition setting and image formation in minutes
- High and low vacuum modes for managing a wide variety of samples
... Read More | The all-new JIB-PS500i is a multipurpose FIB-SEM that delivers the synergy of fast sample preparation, SEM imaging and EDS analysis in a single instrument. The flexibility of this new FIB-SEM makes it ideal for both industry and academia.
Key Features
- Fast High-Quality TEM Sample Preparation
The
The all-new JIB-PS500i is a multipurpose FIB-SEM that delivers the synergy of fast sample preparation, SEM imaging and EDS analysis in a single instrument. The flexibility of this new FIB-SEM makes it ideal for both industry and academia.
Key Features
- Fast High-Quality TEM Sample Preparation
The new FIB stage offers fast transitioning between processing and imaging, providing real-time feedback of specimen quality. With the ability to prepare samples thinner than 30nm, the FIB-SEM enables superior atomic resolution imaging and analysis with STEM and TEM. A retractable STEM detector enables simultaneous acquisition of bright field and dark field images to precisely evaluate preparation of the TEM sample.
- New Large Chamber/Stage for Ultimate Flexibility
The FIB’s large specimen chamber with easy-access door and easily accessible stage allows an efficient workflow and flexibility for a variety of samples and processes. The 5-axis full-eucentric large motor stage supports large samples and is designed for a wide range of XY travel and stage tilt and rotation.
- New FIB Column with higher current and superior performance at low kV
The high current (up to 100 nA) FIB column is especially effective for large-area milling and analysis, ideal for semiconductor samples. The new FIB has high performance fine milling capabilities essential for quality lamella preparation for imaging, EDS analysis, and 3D microscopy. The new JIB-PS500i is designed for superior performance in the low kV range, as low as 0.5kV, essential for beam sensitive materials.
- Robust Workflow with TEM-Linkage
A new high-throughput, robust workflow from specimen preparation to TEM imaging. TEM-Linkage consists of a double tilt cartridge and TEM holder that facilitates transfer of samples directly from the FIB to the TEM.
... Read More |
| Resolution | Inquire | SEM : 0.7 nm (15 kV) ; 1.4 nm (1 kV); 1.0 nm (1 kV, BD mode)
FIB:3 nm (at 30 kV) |
| Applications | Materials characterization, eds analysis, elemental analysis, SEM images | Inquire |
| Detector(s) | Backscattered electron detector | Secondary electron detector (SED),
Upper electron detector (UED),
In-lens backscattered electron detector (iBED) |
| Get Quote | | |