| Description | Research grade EPMA that provides both high imaging resolution and analytical resolution with a very high and stable probe current for optimum analytical performance.A new GUI provides a simplified work flow called "Easy EPMA" with built-in software and graphic-driven procedures for a broad range ofResearch grade EPMA that provides both high imaging resolution and analytical resolution with a very high and stable probe current for optimum analytical performance.A new GUI provides a simplified work flow called "Easy EPMA" with built-in software and graphic-driven procedures for a broad range of user experience from the novice/occasional user to complete flexibility and capabilities for the very experienced EPMA scientist.
Key Features
- Higher total probe current deliverable to the sample
- Performs both beam scanned line scans and maps as well as large area line scans and maps with stage scanning
- Maximum beam current of 3 µAmps at the sample, at 30kV, assuring the ability to get sufficient beam currents at low kV for fast, high spatial resolution microanalysis
- Flexible, customizable configuration of spectrometers and crystals
- Supports JEOL Soft XRay Emission Spectrometers
... Read More | This 4th generation Neoscope incorporates advanced technology and functions that make it simple for users at any skill level to obtain outstanding SEM images and elemental analysis results in minutes. It is equipped with a large chamber, high and low vacuum modes, secondary and backscatter electron This 4th generation Neoscope incorporates advanced technology and functions that make it simple for users at any skill level to obtain outstanding SEM images and elemental analysis results in minutes. It is equipped with a large chamber, high and low vacuum modes, secondary and backscatter electron detectors, real-time 3D imaging, highly-advanced auto functions and the option to add a fully embedded EDS with real-time, ‘Live’ analysis.
This 4th generation NeoScope™ is SMART-FLEXIBLE-POWERFUL.
Smart - The latest innovations built to our benchtop platform make this SEM accessible to everyone. Seamless navigation across the sample allows you to quickly go from an optical image to high resolution SEM imaging and analysis. Automatic condition setting based on sample type and application ensures high quality results and enhances productivity. Highly-advanced auto functions generate images of exceptional fidelity.
Flexible-Choose a platform that is right for you. Add options such as our Stage Navigation System (color camera), fully-embedded EDS for elemental analysis and Smile View Map for 3D image reconstruction and surface texture analysis.
Powerful - The high resolution W filament source allows magnification up to 100,000X. A benchtop SEM with both secondary electron and backscatter electron detectors, plus high and low vacuum modes allow for the study of a wide variety of sample types. Automated montage is built-in for high resolution view over a larger area. Includes montage X-ray map with EDS option. The BSE detector supports live 3D imaging for intuitive knowledge of sample surface shape.
LIVE ANALYSIS
Our analytical model includes JEOL’s fully embedded EDS system which provides real time EDS spectra during image observation. With Live Analysis you can:
- View EDS spectra in real time as you search for the area of interest.
- Set analysis points, areas, map position and line scan from the live image observation screen.
- View major elements as displayed on the live EDS window.
... Read More | InTouchScope™ Scanning Electron Microscope Series
The JSM-IT210 InTouchScope™ SEM Series incorporates the latest in JEOL intelligent technology and automation in a compact package.
Smart – Flexible – Powerful - Smart – The latest innovations with our InTouchScope™ series SEMs make them accessible at
InTouchScope™ Scanning Electron Microscope Series
The JSM-IT210 InTouchScope™ SEM Series incorporates the latest in JEOL intelligent technology and automation in a compact package.
Smart – Flexible – Powerful - Smart – The latest innovations with our InTouchScope™ series SEMs make them accessible at every level. A Specimen Exchange mode guides a new operator step-by-step from sample introduction to automatic condition setting and image formation. JEOL’s intelligent technology delivers best-in-class auto functions from alignment to focus for fast, clear, high-resolution images. With our built-in optical camera for navigation and seamless transition to SEM imaging the workflow is fast and easy. View Live EDS both spectrum and X-ray maps with our analytical models. Take it to the next level with built-in automation, from Montage (large area mosaics) to Simple SEM for automatic image collection at multiple locations, magnifications, and conditions. All this technology is packed into a compact platform for unprecedented ease-of-use.
- Flexible – Choose a platform that is right for you. We offer high vacuum and low vacuum models with or without our Live (embedded) EDS system. [JSM-IT210, JSM-IT210A, JSM-IT210LV, JSM-IT210LA].
- Powerful – High resolution tungsten source with unsurpassed low voltage performance. Enhanced algorithms for automatic beam alignment, auto focus and stigma correction allow you to focus on results. The high precision, 5-axis motorized stage enhances throughput. Zeromag with its integrated color camera allows for intuitive navigation to the area of interest and seamless transition to SEM imaging and analysis. Our high sensitivity quadrant BSE detector provides a Live 3D surface reconstruction enhancing your view of specimens with complex topography. Analytical models include JEOL’s fully embedded EDS system for Real-Time, Live EDS spectra and Live X-ray maps. Internal Data Management links all data for instant view of analysis locations.
... Read More | High Resolution Large Chamber SEM
The JSM-IT710HR Field Emission SEM is a compact, versatile Schottky Field Emission SEM that delivers the next level of intelligent technology for high spatial resolution imaging and analysis.
Our unique in-lens field emission gun and advanced electron optics High Resolution Large Chamber SEM
The JSM-IT710HR Field Emission SEM is a compact, versatile Schottky Field Emission SEM that delivers the next level of intelligent technology for high spatial resolution imaging and analysis.
Our unique in-lens field emission gun and advanced electron optics deliver large probe currents while maintaining a small probe making this microscope ideally suited for high resolution applications. This highly versatile SEM is compact in design yet is equipped with a large chamber and both High and Low Vacuum modes for managing a wide variety of specimen types in their native state.
Smart – Flexible - Powerful - Smart – Accessible at any level with the latest innovations from JEOL’s intelligent technology. Best-in-class auto functions from alignment to focus delivers clear, high-resolution images in seconds. The workflow is fast with Zeromag, using our built-in optical camera for navigation and seamless transition to SEM imaging. View Live EDS both spectrum and X-ray maps with our analytical models. We’ve taken it to the next level by including Automation, from Montage (large area mosaics) to Simple SEM for automatic image collection at multiple locations, magnifications, and conditions. All this technology is packed into a compact platform for unprecedented ease-of-use.
- Flexible – The JSM-IT710HR is equipped with a large specimen chamber with multiple ports that are optimally positioned for analytical attachments such as: multiple EDS, EBSD (co-planar with EDS), WDS, CL, STEM, heating/cooling sub-stages etc. There is a large, internal, mechanically eucentric stage with the advantage of easy placement of large and heavy specimens and arranging their orientation prior to closing the door and evacuating the chamber.
- Powerful – The combination of JEOL’s unique in-lens field emission gun with up to 300nA of beam current and the aperture angle control lens which optimizes large probe currents to the smallest probe diameter delivers high spatial resolution imaging and analytical results. Our high-sensitivity, quadrant BSE detector provides a Live 3D surface reconstruction enhancing your view of specimens with complex topography. Analytical models include JEOL’s fully embedded EDS system for Real-Time, Live EDS spectra and Live X-ray maps. Built-in automation both streamlines and enhances throughput and internal Data Management software links all data for instant view of analysis locations. This SEM also supports live web viewing and remote control and is open to Python scripting.
... Read More | An easy to use benchtop SEM with advanced features of full-sized SEMs. User can easily navigate from an optical image to high resolution SEM imaging and further analysis, set automatic conditions based on sample type and application, ensuring high quality results and enhanced productivity. ProducesAn easy to use benchtop SEM with advanced features of full-sized SEMs. User can easily navigate from an optical image to high resolution SEM imaging and further analysis, set automatic conditions based on sample type and application, ensuring high quality results and enhanced productivity. Produces images of exceptional fidelity. Simple to use for any skill level to obtain outstanding SEM images and elemental analysis results in minutes.
Features: - Large specimen chamber
- Secondary and backscatter electron detectors
- Real-time 3D imaging
- Option to add a fully embedded EDS with real-time, ‘Live’ analysis
- High resolution (100,000X) and large depth of field
- Selectable kV modes
Benefits: - View EDS spectra in real time as you search for the area of interest.
- Highly-advanced Auto functions for automatic condition setting and image formation in minutes
- High and low vacuum modes for managing a wide variety of samples
... Read More |
| Applications | Inquire | Provides outstanding SEM images and elemental analysis results in minutes | Compact stationary scanning electron microscope, embedded EDS, live analysis, heat-sensitive specimens, element maps | High spatial resolution imaging and analysis | Materials characterization, eds analysis, elemental analysis, SEM images |