How Does a Scanning Electron Microscope Work?
A scanning electron microscope (also commonly abbreviated as SEM) uses beams of electrons to create magnified images of samples, as opposed to beams of light that a traditional microscope uses. SEMs use electrons that are bounced off near the surface region of a sample. Because the wavelength of electrons is notably smaller than that of light, the resolution of SEMs is greatly superior to that of a light microscope.
What Are Scanning Electron Microscopes Used For?
Because the SEM can magnify a sample up to 500,000 times its normal size and determine its chemical makeup, scanning electron microscopes have a wide range of applications. They are used for quality control in both the pharmaceutical and semiconductor industries, sample comparisons in forensics, diagnostics in medical labs, and in research labs to determine the composition of samples treated in different ways.
What Types of Scanning Electron Microscopes Are There?
Scanning electron microscopes have different kinds of signal detectors available that include back-scattered electrons (for imaging), characteristic X-rays (for determining types and amounts of elements present in the sample), transmitted electrons, and cathodoluminescence. Other variations in different scanning electron microscopes include availability of low or high vacuum mode and imaging options for bright field samples and/or dark field samples.
Check out this article "Integrated SEM Workflow Creates Powerful 'Nano-lab' " to see more ways in which SEM can be a valuable tool for your lab.
|  |  |
| Company | JEOL USA, Inc. | JEOL USA, Inc. |
| Item | JAMP-9510F Field Emission Auger Microprobe | JXA-iSP100 Electron Probe Micro-Analyzer |
| Catalog Number | JAMP-9510F | JXA-iSP100 |
| Price | | |
| Description | The JAMP-9510F offers the highest spatial resolution available in an Auger microprobe: (min. probe diameter of 3nm SEI; 8nm for Auger analysis). Employing a low-aberration condenser lens (in which an electrostatic field and a magnetic field are superposed), combined with a patented "in-lens' The JAMP-9510F offers the highest spatial resolution available in an Auger microprobe: (min. probe diameter of 3nm SEI; 8nm for Auger analysis). Employing a low-aberration condenser lens (in which an electrostatic field and a magnetic field are superposed), combined with a patented "in-lens' Schottky field emission gun, the JAMP-9510F obtains very small spot sizes with beam currents up to 200nA.
Key Features
- 3nm SEI resolution
- 8nm probe diameter for Auger analysis
- Variable energy resolution from 0.05% to 0.6%
- Chemical state analysis in several 10nm areas
- Neutralizing gun allows Auger analysis of insulating materials
- Large specimen stage - samples up to 95mm in diameter
... Read More | Research grade EPMA that provides both high imaging resolution and analytical resolution with a very high and stable probe current for optimum analytical performance. This new microprobe has a new SEM and EDS user interface (GUI) based on the FEG SEM's "SEM Center". It includes new algorithms for Research grade EPMA that provides both high imaging resolution and analytical resolution with a very high and stable probe current for optimum analytical performance. This new microprobe has a new SEM and EDS user interface (GUI) based on the FEG SEM's "SEM Center". It includes new algorithms for the auto functions of both the SEM column and the optical microscope. A new GUI provides a simplified work flow called "Easy EPMA" with built-in software and graphic-driven procedures for a broad range of user experience from the novice/occasional user to complete flexibility and capabilities for the very experienced EPMA scientist.
Key Features
- Customizable configuration of spectrometers and crystals optimized for the required application
- Performs both beam scanned line scans and maps as well as large area line scans and maps with stage scanning
- A 30mm2 integrated and embedded UTW-SDD-EDS system with high sensitivity including an in situ aperture wheel for ultrahigh beam current operation without compromising EDS spectrometer resolution and "Live" survey EDS acquisition to easily help find elements of interest
- Specimen chamber supports both a panchromatic high bandwidth imaging CL and a fully quantitative hyper-spectral CL (xCLent V System) with no loss of a WDS or any limitation on image collection
- Supports the installation of JEOL's Soft X-Ray Emission Spectrometers (SXES and SXES-ER) for ultralight elements and chemical state analysis
... Read More |
| Type | Auger microprobe | Inquire |
| Resolution | 3nm(at 25kV, 10pA) | 6 nm (5 nm with LaB6 emitter) |
| Specimen Size | Up to 20 mm in diameter (5 mm thick) | Inquire |
| Probe Current | 10-11 to 2×10-7 A | Inquire |
| Applications | Enables precise chemical bonding state analysis and compositional mapping, making it indispensable for researchers and engineers in materials science, nanotechnology, and related fields.? | High-resolution imaging, quantitative elemental analysis, and chemical state analysis |
| Detector(s) | Multi-channel detection | Inquire |
| Get Quote | | |