How Does a Scanning Electron Microscope Work?
A scanning electron microscope (also commonly abbreviated as SEM) uses beams of electrons to create magnified images of samples, as opposed to beams of light that a traditional microscope uses. SEMs use electrons that are bounced off near the surface region of a sample. Because the wavelength of electrons is notably smaller than that of light, the resolution of SEMs is greatly superior to that of a light microscope.
What Are Scanning Electron Microscopes Used For?
Because the SEM can magnify a sample up to 500,000 times its normal size and determine its chemical makeup, scanning electron microscopes have a wide range of applications. They are used for quality control in both the pharmaceutical and semiconductor industries, sample comparisons in forensics, diagnostics in medical labs, and in research labs to determine the composition of samples treated in different ways.
What Types of Scanning Electron Microscopes Are There?
Scanning electron microscopes have different kinds of signal detectors available that include back-scattered electrons (for imaging), characteristic X-rays (for determining types and amounts of elements present in the sample), transmitted electrons, and cathodoluminescence. Other variations in different scanning electron microscopes include availability of low or high vacuum mode and imaging options for bright field samples and/or dark field samples.
Check out this article "Integrated SEM Workflow Creates Powerful 'Nano-lab' " to see more ways in which SEM can be a valuable tool for your lab.
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| Company | JEOL USA, Inc. | JEOL USA, Inc. |
| Item | JIB-PS500i FIB-SEM | JCM-7000 NeoScope Benchtop SEM |
| Catalog Number | JIB-PS500i | JCM-7000 |
| Price | | |
| Description | The all-new JIB-PS500i is a multipurpose FIB-SEM that delivers the synergy of fast sample preparation, SEM imaging and EDS analysis in a single instrument. The flexibility of this new FIB-SEM makes it ideal for both industry and academia.
Key Features
- Fast High-Quality TEM Sample Preparation
The
The all-new JIB-PS500i is a multipurpose FIB-SEM that delivers the synergy of fast sample preparation, SEM imaging and EDS analysis in a single instrument. The flexibility of this new FIB-SEM makes it ideal for both industry and academia.
Key Features
- Fast High-Quality TEM Sample Preparation
The new FIB stage offers fast transitioning between processing and imaging, providing real-time feedback of specimen quality. With the ability to prepare samples thinner than 30nm, the FIB-SEM enables superior atomic resolution imaging and analysis with STEM and TEM. A retractable STEM detector enables simultaneous acquisition of bright field and dark field images to precisely evaluate preparation of the TEM sample.
- New Large Chamber/Stage for Ultimate Flexibility
The FIB’s large specimen chamber with easy-access door and easily accessible stage allows an efficient workflow and flexibility for a variety of samples and processes. The 5-axis full-eucentric large motor stage supports large samples and is designed for a wide range of XY travel and stage tilt and rotation.
- New FIB Column with higher current and superior performance at low kV
The high current (up to 100 nA) FIB column is especially effective for large-area milling and analysis, ideal for semiconductor samples. The new FIB has high performance fine milling capabilities essential for quality lamella preparation for imaging, EDS analysis, and 3D microscopy. The new JIB-PS500i is designed for superior performance in the low kV range, as low as 0.5kV, essential for beam sensitive materials.
- Robust Workflow with TEM-Linkage
A new high-throughput, robust workflow from specimen preparation to TEM imaging. TEM-Linkage consists of a double tilt cartridge and TEM holder that facilitates transfer of samples directly from the FIB to the TEM.
... Read More | This 4th generation Neoscope incorporates advanced technology and functions that make it simple for users at any skill level to obtain outstanding SEM images and elemental analysis results in minutes. It is equipped with a large chamber, high and low vacuum modes, secondary and backscatter electron This 4th generation Neoscope incorporates advanced technology and functions that make it simple for users at any skill level to obtain outstanding SEM images and elemental analysis results in minutes. It is equipped with a large chamber, high and low vacuum modes, secondary and backscatter electron detectors, real-time 3D imaging, highly-advanced auto functions and the option to add a fully embedded EDS with real-time, ‘Live’ analysis.
This 4th generation NeoScope™ is SMART-FLEXIBLE-POWERFUL.
Smart - The latest innovations built to our benchtop platform make this SEM accessible to everyone. Seamless navigation across the sample allows you to quickly go from an optical image to high resolution SEM imaging and analysis. Automatic condition setting based on sample type and application ensures high quality results and enhances productivity. Highly-advanced auto functions generate images of exceptional fidelity.
Flexible-Choose a platform that is right for you. Add options such as our Stage Navigation System (color camera), fully-embedded EDS for elemental analysis and Smile View Map for 3D image reconstruction and surface texture analysis.
Powerful - The high resolution W filament source allows magnification up to 100,000X. A benchtop SEM with both secondary electron and backscatter electron detectors, plus high and low vacuum modes allow for the study of a wide variety of sample types. Automated montage is built-in for high resolution view over a larger area. Includes montage X-ray map with EDS option. The BSE detector supports live 3D imaging for intuitive knowledge of sample surface shape.
LIVE ANALYSIS
Our analytical model includes JEOL’s fully embedded EDS system which provides real time EDS spectra during image observation. With Live Analysis you can:
- View EDS spectra in real time as you search for the area of interest.
- Set analysis points, areas, map position and line scan from the live image observation screen.
- View major elements as displayed on the live EDS window.
... Read More |
| Resolution | SEM : 0.7 nm (15 kV) ; 1.4 nm (1 kV); 1.0 nm (1 kV, BD mode)
FIB:3 nm (at 30 kV) | Inquire |
| Applications | Inquire | Provides outstanding SEM images and elemental analysis results in minutes |
| Detector(s) | Secondary electron detector (SED),
Upper electron detector (UED),
In-lens backscattered electron detector (iBED) | Backscattered electron detector |
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