| Description | High Resolution Large Chamber SEM
The JSM-IT710HR Field Emission SEM is a compact, versatile Schottky Field Emission SEM that delivers the next level of intelligent technology for high spatial resolution imaging and analysis.
Our unique in-lens field emission gun and advanced electron optics High Resolution Large Chamber SEM
The JSM-IT710HR Field Emission SEM is a compact, versatile Schottky Field Emission SEM that delivers the next level of intelligent technology for high spatial resolution imaging and analysis.
Our unique in-lens field emission gun and advanced electron optics deliver large probe currents while maintaining a small probe making this microscope ideally suited for high resolution applications. This highly versatile SEM is compact in design yet is equipped with a large chamber and both High and Low Vacuum modes for managing a wide variety of specimen types in their native state.
Smart – Flexible - Powerful - Smart – Accessible at any level with the latest innovations from JEOL’s intelligent technology. Best-in-class auto functions from alignment to focus delivers clear, high-resolution images in seconds. The workflow is fast with Zeromag, using our built-in optical camera for navigation and seamless transition to SEM imaging. View Live EDS both spectrum and X-ray maps with our analytical models. We’ve taken it to the next level by including Automation, from Montage (large area mosaics) to Simple SEM for automatic image collection at multiple locations, magnifications, and conditions. All this technology is packed into a compact platform for unprecedented ease-of-use.
- Flexible – The JSM-IT710HR is equipped with a large specimen chamber with multiple ports that are optimally positioned for analytical attachments such as: multiple EDS, EBSD (co-planar with EDS), WDS, CL, STEM, heating/cooling sub-stages etc. There is a large, internal, mechanically eucentric stage with the advantage of easy placement of large and heavy specimens and arranging their orientation prior to closing the door and evacuating the chamber.
- Powerful – The combination of JEOL’s unique in-lens field emission gun with up to 300nA of beam current and the aperture angle control lens which optimizes large probe currents to the smallest probe diameter delivers high spatial resolution imaging and analytical results. Our high-sensitivity, quadrant BSE detector provides a Live 3D surface reconstruction enhancing your view of specimens with complex topography. Analytical models include JEOL’s fully embedded EDS system for Real-Time, Live EDS spectra and Live X-ray maps. Built-in automation both streamlines and enhances throughput and internal Data Management software links all data for instant view of analysis locations. This SEM also supports live web viewing and remote control and is open to Python scripting.
... Read More | The JAMP-9510F offers the highest spatial resolution available in an Auger microprobe: (min. probe diameter of 3nm SEI; 8nm for Auger analysis). Employing a low-aberration condenser lens (in which an electrostatic field and a magnetic field are superposed), combined with a patented "in-lens' The JAMP-9510F offers the highest spatial resolution available in an Auger microprobe: (min. probe diameter of 3nm SEI; 8nm for Auger analysis). Employing a low-aberration condenser lens (in which an electrostatic field and a magnetic field are superposed), combined with a patented "in-lens' Schottky field emission gun, the JAMP-9510F obtains very small spot sizes with beam currents up to 200nA.
Key Features
- 3nm SEI resolution
- 8nm probe diameter for Auger analysis
- Variable energy resolution from 0.05% to 0.6%
- Chemical state analysis in several 10nm areas
- Neutralizing gun allows Auger analysis of insulating materials
- Large specimen stage - samples up to 95mm in diameter
... Read More | This 4th generation Neoscope incorporates advanced technology and functions that make it simple for users at any skill level to obtain outstanding SEM images and elemental analysis results in minutes. It is equipped with a large chamber, high and low vacuum modes, secondary and backscatter electron This 4th generation Neoscope incorporates advanced technology and functions that make it simple for users at any skill level to obtain outstanding SEM images and elemental analysis results in minutes. It is equipped with a large chamber, high and low vacuum modes, secondary and backscatter electron detectors, real-time 3D imaging, highly-advanced auto functions and the option to add a fully embedded EDS with real-time, ‘Live’ analysis.
This 4th generation NeoScope™ is SMART-FLEXIBLE-POWERFUL.
Smart - The latest innovations built to our benchtop platform make this SEM accessible to everyone. Seamless navigation across the sample allows you to quickly go from an optical image to high resolution SEM imaging and analysis. Automatic condition setting based on sample type and application ensures high quality results and enhances productivity. Highly-advanced auto functions generate images of exceptional fidelity.
Flexible-Choose a platform that is right for you. Add options such as our Stage Navigation System (color camera), fully-embedded EDS for elemental analysis and Smile View Map for 3D image reconstruction and surface texture analysis.
Powerful - The high resolution W filament source allows magnification up to 100,000X. A benchtop SEM with both secondary electron and backscatter electron detectors, plus high and low vacuum modes allow for the study of a wide variety of sample types. Automated montage is built-in for high resolution view over a larger area. Includes montage X-ray map with EDS option. The BSE detector supports live 3D imaging for intuitive knowledge of sample surface shape.
LIVE ANALYSIS
Our analytical model includes JEOL’s fully embedded EDS system which provides real time EDS spectra during image observation. With Live Analysis you can:
- View EDS spectra in real time as you search for the area of interest.
- Set analysis points, areas, map position and line scan from the live image observation screen.
- View major elements as displayed on the live EDS window.
... Read More | Research grade EPMA that provides both high imaging resolution and analytical resolution with a very high and stable probe current for optimum analytical performance.A new GUI provides a simplified work flow called "Easy EPMA" with built-in software and graphic-driven procedures for a broad range ofResearch grade EPMA that provides both high imaging resolution and analytical resolution with a very high and stable probe current for optimum analytical performance.A new GUI provides a simplified work flow called "Easy EPMA" with built-in software and graphic-driven procedures for a broad range of user experience from the novice/occasional user to complete flexibility and capabilities for the very experienced EPMA scientist.
Key Features
- Higher total probe current deliverable to the sample
- Performs both beam scanned line scans and maps as well as large area line scans and maps with stage scanning
- Maximum beam current of 3 µAmps at the sample, at 30kV, assuring the ability to get sufficient beam currents at low kV for fast, high spatial resolution microanalysis
- Flexible, customizable configuration of spectrometers and crystals
- Supports JEOL Soft XRay Emission Spectrometers
... Read More | Research grade EPMA that provides both high imaging resolution and analytical resolution with a very high and stable probe current for optimum analytical performance. This new microprobe has a new SEM and EDS user interface (GUI) based on the FEG SEM's "SEM Center". It includes new algorithms for Research grade EPMA that provides both high imaging resolution and analytical resolution with a very high and stable probe current for optimum analytical performance. This new microprobe has a new SEM and EDS user interface (GUI) based on the FEG SEM's "SEM Center". It includes new algorithms for the auto functions of both the SEM column and the optical microscope. A new GUI provides a simplified work flow called "Easy EPMA" with built-in software and graphic-driven procedures for a broad range of user experience from the novice/occasional user to complete flexibility and capabilities for the very experienced EPMA scientist.
Key Features
- Customizable configuration of spectrometers and crystals optimized for the required application
- Performs both beam scanned line scans and maps as well as large area line scans and maps with stage scanning
- A 30mm2 integrated and embedded UTW-SDD-EDS system with high sensitivity including an in situ aperture wheel for ultrahigh beam current operation without compromising EDS spectrometer resolution and "Live" survey EDS acquisition to easily help find elements of interest
- Specimen chamber supports both a panchromatic high bandwidth imaging CL and a fully quantitative hyper-spectral CL (xCLent V System) with no loss of a WDS or any limitation on image collection
- Supports the installation of JEOL's Soft X-Ray Emission Spectrometers (SXES and SXES-ER) for ultralight elements and chemical state analysis
... Read More |
| Applications | High spatial resolution imaging and analysis | Enables precise chemical bonding state analysis and compositional mapping, making it indispensable for researchers and engineers in materials science, nanotechnology, and related fields.? | Provides outstanding SEM images and elemental analysis results in minutes | Inquire | High-resolution imaging, quantitative elemental analysis, and chemical state analysis |