| Description | High Resolution Large Chamber SEM
The JSM-IT710HR Field Emission SEM is a compact, versatile Schottky Field Emission SEM that delivers the next level of intelligent technology for high spatial resolution imaging and analysis.
Our unique in-lens field emission gun and advanced electron optics High Resolution Large Chamber SEM
The JSM-IT710HR Field Emission SEM is a compact, versatile Schottky Field Emission SEM that delivers the next level of intelligent technology for high spatial resolution imaging and analysis.
Our unique in-lens field emission gun and advanced electron optics deliver large probe currents while maintaining a small probe making this microscope ideally suited for high resolution applications. This highly versatile SEM is compact in design yet is equipped with a large chamber and both High and Low Vacuum modes for managing a wide variety of specimen types in their native state.
Smart – Flexible - Powerful - Smart – Accessible at any level with the latest innovations from JEOL’s intelligent technology. Best-in-class auto functions from alignment to focus delivers clear, high-resolution images in seconds. The workflow is fast with Zeromag, using our built-in optical camera for navigation and seamless transition to SEM imaging. View Live EDS both spectrum and X-ray maps with our analytical models. We’ve taken it to the next level by including Automation, from Montage (large area mosaics) to Simple SEM for automatic image collection at multiple locations, magnifications, and conditions. All this technology is packed into a compact platform for unprecedented ease-of-use.
- Flexible – The JSM-IT710HR is equipped with a large specimen chamber with multiple ports that are optimally positioned for analytical attachments such as: multiple EDS, EBSD (co-planar with EDS), WDS, CL, STEM, heating/cooling sub-stages etc. There is a large, internal, mechanically eucentric stage with the advantage of easy placement of large and heavy specimens and arranging their orientation prior to closing the door and evacuating the chamber.
- Powerful – The combination of JEOL’s unique in-lens field emission gun with up to 300nA of beam current and the aperture angle control lens which optimizes large probe currents to the smallest probe diameter delivers high spatial resolution imaging and analytical results. Our high-sensitivity, quadrant BSE detector provides a Live 3D surface reconstruction enhancing your view of specimens with complex topography. Analytical models include JEOL’s fully embedded EDS system for Real-Time, Live EDS spectra and Live X-ray maps. Built-in automation both streamlines and enhances throughput and internal Data Management software links all data for instant view of analysis locations. This SEM also supports live web viewing and remote control and is open to Python scripting.
... Read More | The all-new JIB-PS500i is a multipurpose FIB-SEM that delivers the synergy of fast sample preparation, SEM imaging and EDS analysis in a single instrument. The flexibility of this new FIB-SEM makes it ideal for both industry and academia.
Key Features
- Fast High-Quality TEM Sample Preparation
The
The all-new JIB-PS500i is a multipurpose FIB-SEM that delivers the synergy of fast sample preparation, SEM imaging and EDS analysis in a single instrument. The flexibility of this new FIB-SEM makes it ideal for both industry and academia.
Key Features
- Fast High-Quality TEM Sample Preparation
The new FIB stage offers fast transitioning between processing and imaging, providing real-time feedback of specimen quality. With the ability to prepare samples thinner than 30nm, the FIB-SEM enables superior atomic resolution imaging and analysis with STEM and TEM. A retractable STEM detector enables simultaneous acquisition of bright field and dark field images to precisely evaluate preparation of the TEM sample.
- New Large Chamber/Stage for Ultimate Flexibility
The FIB’s large specimen chamber with easy-access door and easily accessible stage allows an efficient workflow and flexibility for a variety of samples and processes. The 5-axis full-eucentric large motor stage supports large samples and is designed for a wide range of XY travel and stage tilt and rotation.
- New FIB Column with higher current and superior performance at low kV
The high current (up to 100 nA) FIB column is especially effective for large-area milling and analysis, ideal for semiconductor samples. The new FIB has high performance fine milling capabilities essential for quality lamella preparation for imaging, EDS analysis, and 3D microscopy. The new JIB-PS500i is designed for superior performance in the low kV range, as low as 0.5kV, essential for beam sensitive materials.
- Robust Workflow with TEM-Linkage
A new high-throughput, robust workflow from specimen preparation to TEM imaging. TEM-Linkage consists of a double tilt cartridge and TEM holder that facilitates transfer of samples directly from the FIB to the TEM.
... Read More |