| Description | The XtaLAB Synergy-R is the most powerful small molecule diffractometer available. It includes a high-flux, low-maintenance microfocus rotating anode, the PhotonJet-R, with a high-precision kappa goniometer and Rigaku’s own Hybrid Photon Counting (HPC) X-ray detector the HyPix-6000HE. The PhotonJet-The XtaLAB Synergy-R is the most powerful small molecule diffractometer available. It includes a high-flux, low-maintenance microfocus rotating anode, the PhotonJet-R, with a high-precision kappa goniometer and Rigaku’s own Hybrid Photon Counting (HPC) X-ray detector the HyPix-6000HE. The PhotonJet-R X-ray source is comprised of a Micromax-007 HF rotating anode and a newly designed optic. It is available with either Cu or Mo anodes.
This single crystal X-ray diffractometer has been specially designed to fully integrate the rotating anode X-ray source with all system components and software making it a sleek, simple to use diffractometer without compromising the X-ray intensity.
For labs with high-throughput requirements, increasing the flux reduces data collection time and thus increases the number of samples that can be studied in your laboratory. For extremely small samples, additional flux will extend the minimum size limits for crystals that you can study.
Features: - True shutterless data collection
- Noise-free HPC X-ray detector for better measurement of weak data
- 4-circle kappa goniometer with high accuracy and speed
- Fast workflow due to complete integration of software and hardware
- Excels at the most challenging applications, e.g. MOFs or incommensurate structures
- Extremely high performance due to bright source, noise-free detector and fast goniometer speeds
- Provides unparalleled throughput
- Compact design to fit in your laboratory
... Read More | The AutoMATE II can measure large and heavy parts (30 kg with standard manual Z stage; 20 kg with optional automated XYZ stage) with high accuracy.
The X-ray source and detector arm are mounted on a highly accurate two-axis goniometer that can position them relative to the measurement site and The AutoMATE II can measure large and heavy parts (30 kg with standard manual Z stage; 20 kg with optional automated XYZ stage) with high accuracy.
The X-ray source and detector arm are mounted on a highly accurate two-axis goniometer that can position them relative to the measurement site and perform scans with minimum steps of 0.1 microns when using the automated XYZ stage.
Features: - Highly accurate goniometer allows for true micro-area residual stress measurement.
- Automatic mapping measurements with teaching function.
- An X-ray radiation enclosure with interlock system automatically locks the enclosure door when the X-ray shutter is open.
- The measurement position is adjusted by _x000B_a CCD camera equipped with a microscope having a zoom function.
- The two-axis goniometer system allows for both iso-inclination _x000B_and side-inclination methods automatically without readjustment of the sample position.
... Read More | The SmartLab high-resolution diffraction system represents the state of the art in fully automated modular XRD systems. The system incorporates a high resolution theta/theta closed loop goniometer drive system, CBO, an in-plane scattering arm, an optional 9.0 kW rotating anode generator, and a fullyThe SmartLab high-resolution diffraction system represents the state of the art in fully automated modular XRD systems. The system incorporates a high resolution theta/theta closed loop goniometer drive system, CBO, an in-plane scattering arm, an optional 9.0 kW rotating anode generator, and a fully automated optical system to make advanced measurements possible for both expert and novice users of the system.
Winner of the 2006 R&D 100 Award for technical innovation, the SmartLab is design for completely automated analysis of thin films and other advanced materials. Powered by Guidance, Rigaku's revolutionary knowledge based software package, SmartLab uses fully deveopled measurement packages for completely automated measurement of thin films, nanomaterials, powders, and liquids. Measurement packages exist for powder diffraction, glancing incidence diffraction, in-plane diffraction, X-ray reflectivity, and small angle X-ray scattering (SAXS) measurements.
Features - Θ/Θ design for horizontal sample mounting
- Closed loop drive system for high resolution scanning
- Optional 9.0 kW rotating anode generator
- Fully automatic system alignment
- Guidance software based automated measurement
- 300 mm wafer handling
- CBO for focusing and parallel beam geometries without reconfiguration
- In-plane diffraction arm for in-plane measurements without reconfiguration
- High resolution optics
- SAXS capabilities
... Read More | Customized Single Crystal Diffraction System With Microfocus Rotating Anode Generator
Features: - Ultimate flexibility with customized X-ray system specifically tailored to the needs of your research. Dual ports allow for various combinations of crystallography and SAXS configurations. Your choice
Customized Single Crystal Diffraction System With Microfocus Rotating Anode Generator
Features: - Ultimate flexibility with customized X-ray system specifically tailored to the needs of your research. Dual ports allow for various combinations of crystallography and SAXS configurations. Your choice of VariMax™ confocal double-bounce optics for better spectral purity and beam size to match your sample types.
- Faster, accurate data collection due to high-speed kappa goniometer, high-flux rotating anode X-ray source, fast, low-noise X-ray detector, and highly optimized instrument control software.
- Improve your ability to investigate small samples due to the increased flux from the rotating anode X-ray source as well as the extreme low noise of the HyPix X-ray detectors. Noise-free images mean you can count longer for weakly diffracting crystals without a loss in data quality arising from detector noise.
- Screen crystals in situ with optional XtalCheck crystallization plate screening device.
- Enhance your ability to resolve large unit cells, twins or incommensurate lattices when you select the optional motorized variable beam slit in order to alter divergence to adapt the source to your sample’s requirements.
... Read More | The XtaLAB Synergy-ED is the world’s first 3DED/microED (3D Electron Diffraction/micro Electron Diffraction) system and the successful culmination of a joint development project between Rigaku and JEOL. 3DED/microED allows crystallographers to probe the structure of crystals and The XtaLAB Synergy-ED is the world’s first 3DED/microED (3D Electron Diffraction/micro Electron Diffraction) system and the successful culmination of a joint development project between Rigaku and JEOL. 3DED/microED allows crystallographers to probe the structure of crystals and nanocrcrystals as small as tens of nanometers, opening up many new possibilities. This new capability allows you to go beyond the limitations of X-ray diffraction (XRD), which requires samples greater them 1 µm.
- Directly determine 3D molecular structures of submicron crystals for the first time
- Rigaku’s high-speed, high-sensitivity photon counting detector - HyPix-ED
- JEOL’s expertise in generation and control of stable electron beams – 200 kV electron source and optics
- Rigaku’s powerful single crystal analysis software – CrysAlisPro-ED
3DED/microED is an excellent complementary technique to XRD, and the compact design of the XtaLAB Synergy-ED allows it to be easily located in laboratories alongside these instruments. Crystallographers familiar with Rigaku diffractometers running CrysAlisPRO will be able to adapt to the CrysAlisPRO-ED interface very quickly, as it is based on the same intuitive platform.
The fully integrated system incorporates a seamless workflow from data collection to structure determination of three-dimensional molecular structures. AutoChem, which is fully integrated into CrysAlisPRO, performs fast, fully automated structure solution and refinement during data collection, optimizing your productivity.
3DED/microED allows direct structural determination of sub-micron sized crystals that could only previously be postulated by techniques such as NMR. As an emerging technique, there is scope for the generation of many publications using the XtaLAB Synergy-ED.
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