X-Ray Diffractometer (XRD Instruments)

X-ray diffraction (XRD) allows one to ascertain the molecular structure of a crystalline material by diffracting X-rays through the sample. An XRD analyzer obtains interference patterns reflecting lattice structures by varying the angle of incidence of the X-ray beam. Thus, the precision, speed of rotation, and beam size of the X-rays become important parameters by which to judge products. Benchtop XRD can be targeted for single crystal diffraction for imaging lattices; powder diffraction for phase determination; identifying unfamiliar substances for use in inspection, crystallography, and pharmaceutical research correlating crystal structures with drug efficacy. X-ray generators can reach 18 KW in power and detectors typically come as compound silicon arrays, Peltier-Cooled, Silicon Drift, or Scintillation Counter variants. Software targeted for specific XRD applications is available for upgrade in some analyzer models.

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CompanyRigaku CorporationRigaku CorporationRigaku CorporationRigaku Corporation
ItemXtaLAB Synergy-S Single or Dual Microfocus X-ray DiffractometerAutoMATE IIMiniflex XpC XRDSmartLab High-Resolution Diffraction System
Citations
Catalog NumberXtaLAB Synergy-SAutoMATE IIMiniFlex XpCSmartLab
Price
X-Ray TubeInquireCr (Maximum load 2 kW), Effective focus size 1 × 10 mm2 (N.F.), Short type600 W3 kW sealed X-ray tube
X-Ray GeneratorInquire3 kW sealed X-ray tubeCompact 800 W generator and compact X-ray tube9.0 kW Rotating Anode Generator
Goniometer TypeInquiretwo-axis goniometerΘ-Θ sample horizontal goniometerHigh Resolution Theta/Theta Closed Loop
Detector(s)InquireD/teX Ultra 1000D/teX Ultra silicon stripD/teX Ultra 250 silicon strip detector
DescriptionWith your success utmost in our minds, we have developed the XtaLAB Synergy-S X-ray diffractometer for single crystal X-ray diffraction. Using a combination of leading edge components and user-inspired software tied together through a highly parallelized architecture, the XtaLAB Synergy-S produces ... Read MoreThe AutoMATE II can measure large and heavy parts (30 kg with standard manual Z stage; 20 kg with optional automated XYZ stage) with high accuracy.

The X-ray source and detector arm are mounted on a highly accurate two-axis goniometer that can position them relative to the measurement site and
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The Miniflex XpC is an X-ray diffractometer designed specifically for quality control in cement plants and other operations requiring online process control such as pharmaceuticals and batteries. It has been optimized for speed and accuracy, bringing lab-quality performance to the manufacturing ... Read MoreThe SmartLab high-resolution diffraction system represents the state of the art in fully automated modular XRD systems. The system incorporates a high resolution theta/theta closed loop goniometer drive system, CBO, an in-plane scattering arm, an optional 9.0 kW rotating anode generator, and a fully... Read More
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