X-ray diffraction (XRD) allows one to ascertain the molecular structure of a crystalline material by diffracting X-rays through the sample. An XRD analyzer obtains interference patterns reflecting lattice structures by varying the angle of incidence of the X-ray beam. Thus, the precision, speed of rotation, and beam size of the X-rays become important parameters by which to judge products. Benchtop XRD can be targeted for single crystal diffraction for imaging lattices; powder diffraction for phase determination; identifying unfamiliar substances for use in inspection, crystallography, and pharmaceutical research correlating crystal structures with drug efficacy. X-ray generators can reach 18 KW in power and detectors typically come as compound silicon arrays, Peltier-Cooled, Silicon Drift, or Scintillation Counter variants. Software targeted for specific XRD applications is available for upgrade in some analyzer models.
Find, compare, and request a quote for X-ray diffractometers (XRD instruments) across leading suppliers at Labcompare; including access to product citations, related published figures, and first-hand reviews from our scientific community.
|  |  |  |  |
| Company | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation |
| Item | XtaLAB Synergy-DW Versatile Dual Wavelength XRD with HPC X-ray Detector | MiniFlex Benchtop X-ray Diffractometer | SmartLab SE X-ray Diffractometer | XtaLAB Synergy-ED Electron Diffractometer |
| Citations | | | | |
| Catalog Number | XtaLAB Synergy-DW | MiniFlex | SmartLab SE | XtaLAB Synergy-ED |
| Price | | | | |
| X-Ray Tube | Inquire | Inquire | 3 kW sealed X-ray tube | Inquire |
| X-Ray Generator | Dual wavelength X-ray source | Cu, Co, Fe, or Cr, 40 kV, 15 mA | Inquire | Inquire |
| Goniometer Type | kappa goniometer | Vertical, Theta or 2Theta | Inquire | Single rotation axis |
| Detector(s) | HPC detector | D/teX, Ultra 1D High speed silicon strip detector | HyPix-400 2D, D/teX Ultra 250 1D | High-speed, high-sensitivity photon-counting detector, HyPix-ED |
| Description | One source with two high-flux wavelengths is the foundation of the revolutionary XtaLAB Synergy-DW single crystal X-ray diffractometer. It combines the increased flux of a rotating anode X-ray source with the flexibility of two different wavelengths, making it ideal for laboratories exploring a wideOne source with two high-flux wavelengths is the foundation of the revolutionary XtaLAB Synergy-DW single crystal X-ray diffractometer. It combines the increased flux of a rotating anode X-ray source with the flexibility of two different wavelengths, making it ideal for laboratories exploring a wide range of research interests.
The XtaLAB Synergy-DW diffractometer is based on the proven, low-maintenance MicroMax-007 HF microfocus rotating anode. The target is constructed with two different X-ray source materials (Cu and Mo) and is coupled with an auto-switching dual wavelength optic. Copper or molybdenum X-ray radiation is available at the click of a button. The XtaLAB Synergy-DW offers up to 12x higher flux compared to the standard sealed tube X-ray sources and, utilizing only one generator, means overall maintenance is reduced.
Rounding out the XtaLAB Synergy-DW configuration is the fast and efficient four-circle kappa goniometer which is compatible with a wide range of detectors including the HyPix-6000HE and other Hybrid Photon Counting (HPC) X-ray detectors e.g. PILATUS and EIGER detectors.
Features: - TAccess to two wavelengths in one compact system
- 12x higher flux than sealed tube X-ray sources
- Low maintenance, high performance system
- Uses CrysAlisPro software with both PX and SMX modes
- Multi-functional diffractometer to cover you wherever your research takes you
- High flux performance means you all your crystallography needs can be carried out ‘in-house’
- Very little downtime and easy maintenance
- No need to purchase extra software for different applications
... Read More | New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago.
Overview: - New 6th generation design
- Compact, fail-safe radiation enclosure
- Incident beam variable slit
- Simple installation and user training
- Factory aligned goniometer system
- Laptop computer operation
Measurements: - Phase identification
- Phase quantification
- Percent (%) crystallinity
- Crystallite size and strain
- Lattice parameter refinement
- Rietveld refinement
- Molecular structure
Options: - 8-position autosampler
- Graphite monochromator
- D/teX Ultra: silicon strip detector
- HyPix-400 MF: 2D HPAD detector
- Air sensitive sample holder
- Travel case
... Read More | The SmartLab SE is a highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance. It offers continued refinement of the original ease of use features that enabled the original SmartLab to receive the R&D 100 Award in 2006: automatic alignment, component recognition, cross The SmartLab SE is a highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance. It offers continued refinement of the original ease of use features that enabled the original SmartLab to receive the R&D 100 Award in 2006: automatic alignment, component recognition, cross beam optics and advanced photon counting hybrid pixel array detectors (HPAD).
Features: - SmartLab Studio II software based on a new architecturally integrated modular platform
- Cross-beam optics module switches between Bragg-Brentano and parallel beam without the need to change optics.
- HyPix-400 2D detector enables seamless switch between 0D, 1D and 2D detection mode depending on application type.
- D/teX Ultra 250 1D detector accelerates powder diffraction by a factor of 250 in speed and provides adjustable energy resolution of approximately 20% or 4% depending on
sample type. - Integrated intelligent Guidance software enables fully automated measurement including optics and sample alignment.
- Self-aligned optics maximize instrument uptime and minimize cost of ownership.
... Read More | The XtaLAB Synergy-ED is the world’s first 3DED/microED (3D Electron Diffraction/micro Electron Diffraction) system and the successful culmination of a joint development project between Rigaku and JEOL. 3DED/microED allows crystallographers to probe the structure of crystals and The XtaLAB Synergy-ED is the world’s first 3DED/microED (3D Electron Diffraction/micro Electron Diffraction) system and the successful culmination of a joint development project between Rigaku and JEOL. 3DED/microED allows crystallographers to probe the structure of crystals and nanocrcrystals as small as tens of nanometers, opening up many new possibilities. This new capability allows you to go beyond the limitations of X-ray diffraction (XRD), which requires samples greater them 1 µm.
- Directly determine 3D molecular structures of submicron crystals for the first time
- Rigaku’s high-speed, high-sensitivity photon counting detector - HyPix-ED
- JEOL’s expertise in generation and control of stable electron beams – 200 kV electron source and optics
- Rigaku’s powerful single crystal analysis software – CrysAlisPro-ED
3DED/microED is an excellent complementary technique to XRD, and the compact design of the XtaLAB Synergy-ED allows it to be easily located in laboratories alongside these instruments. Crystallographers familiar with Rigaku diffractometers running CrysAlisPRO will be able to adapt to the CrysAlisPRO-ED interface very quickly, as it is based on the same intuitive platform.
The fully integrated system incorporates a seamless workflow from data collection to structure determination of three-dimensional molecular structures. AutoChem, which is fully integrated into CrysAlisPRO, performs fast, fully automated structure solution and refinement during data collection, optimizing your productivity.
3DED/microED allows direct structural determination of sub-micron sized crystals that could only previously be postulated by techniques such as NMR. As an emerging technique, there is scope for the generation of many publications using the XtaLAB Synergy-ED.
... Read More |
| Get Quote | | | | |