X-ray diffraction (XRD) allows one to ascertain the molecular structure of a crystalline material by diffracting X-rays through the sample. An XRD analyzer obtains interference patterns reflecting lattice structures by varying the angle of incidence of the X-ray beam. Thus, the precision, speed of rotation, and beam size of the X-rays become important parameters by which to judge products. Benchtop XRD can be targeted for single crystal diffraction for imaging lattices; powder diffraction for phase determination; identifying unfamiliar substances for use in inspection, crystallography, and pharmaceutical research correlating crystal structures with drug efficacy. X-ray generators can reach 18 KW in power and detectors typically come as compound silicon arrays, Peltier-Cooled, Silicon Drift, or Scintillation Counter variants. Software targeted for specific XRD applications is available for upgrade in some analyzer models.
Find, compare, and request a quote for X-ray diffractometers (XRD instruments) across leading suppliers at Labcompare; including access to product citations, related published figures, and first-hand reviews from our scientific community.
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| Company | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation |
| Item | XtaLAB Synergy-DW Versatile Dual Wavelength XRD with HPC X-ray Detector | DicifferX WAXS Edition | DicifferX WAXS Edition High-speed wide-angle X-ray Scattering System | XtaLAB Synergy-Custom |
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| Catalog Number | XtaLAB Synergy-DW | | DicifferX WAXS | XtaLAB Synergy-Custom |
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| X-Ray Tube | Inquire | Inquire | 1.2 kW micro source rotating anode X-ray generator | Inquire |
| X-Ray Generator | Dual wavelength X-ray source | High-brilliance rotating anode with multilayer focusing mirror (10^9 cps at 200 µm beam) | Inquire | MicroMax-007 HF microfocus rotating anode source or the highest-flux in-house X-ray source, the FR-X (Mo, Cu, or Cr). |
| Goniometer Type | kappa goniometer | No goniometer (open stage design) | WAXS camera | Fast kappa geometry goniometer |
| Detector(s) | HPC detector | HyPix-6000 2D HPAD on motorized 2-axis stage | High-energy resolution 2D hybrid pixel array detector (HyPix) | HyPix-6000HE, the large theta coverage HyPix-Arc 150° or the Dectris EIGER 4M. |
| Description | One source with two high-flux wavelengths is the foundation of the revolutionary XtaLAB Synergy-DW single crystal X-ray diffractometer. It combines the increased flux of a rotating anode X-ray source with the flexibility of two different wavelengths, making it ideal for laboratories exploring a wideOne source with two high-flux wavelengths is the foundation of the revolutionary XtaLAB Synergy-DW single crystal X-ray diffractometer. It combines the increased flux of a rotating anode X-ray source with the flexibility of two different wavelengths, making it ideal for laboratories exploring a wide range of research interests.
The XtaLAB Synergy-DW diffractometer is based on the proven, low-maintenance MicroMax-007 HF microfocus rotating anode. The target is constructed with two different X-ray source materials (Cu and Mo) and is coupled with an auto-switching dual wavelength optic. Copper or molybdenum X-ray radiation is available at the click of a button. The XtaLAB Synergy-DW offers up to 12x higher flux compared to the standard sealed tube X-ray sources and, utilizing only one generator, means overall maintenance is reduced.
Rounding out the XtaLAB Synergy-DW configuration is the fast and efficient four-circle kappa goniometer which is compatible with a wide range of detectors including the HyPix-6000HE and other Hybrid Photon Counting (HPC) X-ray detectors e.g. PILATUS and EIGER detectors.
Features: - TAccess to two wavelengths in one compact system
- 12x higher flux than sealed tube X-ray sources
- Low maintenance, high performance system
- Uses CrysAlisPro software with both PX and SMX modes
- Multi-functional diffractometer to cover you wherever your research takes you
- High flux performance means you all your crystallography needs can be carried out ‘in-house’
- Very little downtime and easy maintenance
- No need to purchase extra software for different applications
... Read More | Inquire | Breakthrough speed and versatility for polymer structure analysis
- Next-generation WAXS system equipped with a high-brilliance X-ray source
- Structural information captured non-destructively in just a few seconds of exposure
- Time-resolved in-situ measurements for heating, stretching, and
Breakthrough speed and versatility for polymer structure analysis
- Next-generation WAXS system equipped with a high-brilliance X-ray source
- Structural information captured non-destructively in just a few seconds of exposure
- Time-resolved in-situ measurements for heating, stretching, and humidity conditions
DicifferX WAXS Edition redefines what’s possible for in-house WAXS measurements.
By delivering structural insights in seconds, it accelerates decision-making and drives rapid innovation.
Studies once requiring long measurement times or external facilities can now be performed directly in your
own laboratory, streamlining workflows and empowering faster materials development.... Read More | Customized Single Crystal Diffraction System With Microfocus Rotating Anode Generator
Features: - Ultimate flexibility with customized X-ray system specifically tailored to the needs of your research. Dual ports allow for various combinations of crystallography and SAXS configurations. Your choice
Customized Single Crystal Diffraction System With Microfocus Rotating Anode Generator
Features: - Ultimate flexibility with customized X-ray system specifically tailored to the needs of your research. Dual ports allow for various combinations of crystallography and SAXS configurations. Your choice of VariMax™ confocal double-bounce optics for better spectral purity and beam size to match your sample types.
- Faster, accurate data collection due to high-speed kappa goniometer, high-flux rotating anode X-ray source, fast, low-noise X-ray detector, and highly optimized instrument control software.
- Improve your ability to investigate small samples due to the increased flux from the rotating anode X-ray source as well as the extreme low noise of the HyPix X-ray detectors. Noise-free images mean you can count longer for weakly diffracting crystals without a loss in data quality arising from detector noise.
- Screen crystals in situ with optional XtalCheck crystallization plate screening device.
- Enhance your ability to resolve large unit cells, twins or incommensurate lattices when you select the optional motorized variable beam slit in order to alter divergence to adapt the source to your sample’s requirements.
... Read More |
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